Network vs molecular structural characteristics of ge-doped arsenic sulfide glasses: A combined neutron/X-ray diffraction, extended x-ray absorption fine structure, and raman spectroscopic study

Journal of Physical Chemistry C

Volumn 113, Issue 15, 2009, Pages 6231-6242

  Soyer Uzun, S ^a   Sen, S ^a   Aitken, B G ^b  

^a University of California Davis   (United States)

^b Corning Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC SULFIDES; ATOMIC RATIOS; AVERAGE COORDINATION NUMBERS; COMPOSITIONAL DEPENDENCES; COMPOSITIONAL VARIATIONS; DENSITY FLUCTUATIONS; EXTENDED X-RAY ABSORPTION FINE STRUCTURE ANALYSIS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; INTERMEDIATE-RANGE ORDERS; METAL CONTENTS; NOVEL GLASS; RAMAN SPECTROSCOPIC STUDIES; STRUCTURAL CHARACTERISTICS; THERMO-PHYSICAL PROPERTIES;

ABSORPTION; ABSORPTION SPECTRA; ARSENIC; DIFFRACTION; GERMANIUM; GLASS; RAMAN SPECTROSCOPY; REAL TIME SYSTEMS; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; THERMODYNAMIC PROPERTIES; VAN DER WAALS FORCES; X RAY ABSORPTION; X RAY DIFFRACTION ANALYSIS;

ABSORPTION SPECTROSCOPY;

EID: 65249123216     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp810446g     Document Type: Article

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