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Volumn 94, Issue 15, 2009, Pages

Thickness dependence of nanofilm elastic modulus

Author keywords

[No Author keywords available]

Indexed keywords

BASIC PARAMETERS; CONVENTIONAL TREATMENTS; ELASTIC MODULUS MEASUREMENTS; ELECTRONIC DEVICES; NANO-DEVICES; NANO-FILMS; PHYSICAL PARAMETERS; PLAIN STRAINS; SCALING BEHAVIORS; SI-BASED; SOLID THIN FILMS; SURFACE ENERGIES; SURFACE-TO-VOLUME RATIOS; THICKNESS DEPENDENCES; YOUNG'S MODULUS;

EID: 65249112675     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3120763     Document Type: Article
Times cited : (86)

References (14)
  • 7
    • 0034276389 scopus 로고    scopus 로고
    • 0957-4484,. 10.1088/0957-4484/11/3/301
    • R. E. Miller and V. B. Shenoy, Nanotechnology 0957-4484 11, 139 (2000). 10.1088/0957-4484/11/3/301
    • (2000) Nanotechnology , vol.11 , pp. 139
    • Miller, R.E.1    Shenoy, V.B.2
  • 10
    • 34548426489 scopus 로고    scopus 로고
    • 0218-625X,. 10.1142/S0218625X07010044
    • J. -G. Guo and Y. -P. Zhao, Surf. Rev. Lett. 0218-625X 14, 667 (2007). 10.1142/S0218625X07010044
    • (2007) Surf. Rev. Lett. , vol.14 , pp. 667
    • Guo, J.-G.1    Zhao, Y.-P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.