Wetting on fractal superhydrophobic surfaces from "core-shell" particles: A comparison of theory and experiment

Langmuir

Volumn 25, Issue 5, 2009, Pages 3132-3136

  Synytska, Alla ^a   Ionov, Leonid ^b   Grundke, Karina ^a   Stamm, Manfred ^a  

^a LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

^b MAX PLANCK INSTITUTE OF MOLECULAR CELL BIOLOGY AND GENETICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CASSIE-BAXTER MODELS; COMPOSITE SURFACES; CORE SHELLS; FLAT SURFACES; FLUORINATED COMPOUNDS; FRACTAL GEOMETRIES; FRACTAL SURFACES; HYDROPHILIC REGIONS; HYDROPHOBIC REGIONS; LIQUID DROPLETS; META-STABLE STATE; NON-POLAR LIQUIDS; ROUGH SURFACES; SUPER-HYDROPHOBIC; SUPER-HYDROPHOBIC SURFACES; SUPERHYDROPHOBIC BEHAVIORS; SUPERHYDROPHOBIC COATINGS; SURFACE FREE ENERGIES; THEORETICAL INVESTIGATIONS; THEORETICAL PREDICTIONS; WETTING BEHAVIORS; WETTING PROPERTIES;

CONTACT ANGLE; DROP FORMATION; FLUORINE; FORECASTING; FRACTALS; FREE ENERGY; HYDROPHOBICITY; INDUSTRIAL APPLICATIONS; LIQUIDS; POLYSTYRENES; SILANES; SURFACE MEASUREMENT; WETTING;

SURFACE PROPERTIES;

OXIDE; POLYMER; POLYSTYRENE DERIVATIVE; SILICON; SILICON DIOXIDE;

ARTICLE; CHEMICAL PHENOMENA; CHEMISTRY; COLLOID; COMPARATIVE STUDY; FRACTAL ANALYSIS; INFRARED SPECTROSCOPY; METHODOLOGY; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; THERMODYNAMICS; WETTABILITY;

CHEMISTRY; COLLOIDS; FRACTALS; HYDROPHOBIC AND HYDROPHILIC INTERACTIONS; MICROSCOPY, ELECTRON, SCANNING; OXIDES; PARTICLE SIZE; POLYMERS; POLYSTYRENES; SILICON; SILICON DIOXIDE; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE PROPERTIES; THERMODYNAMICS; WETTABILITY;

EID: 65249111484     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la803120d     Document Type: Article

References (49)

1. Barthlott, W.; Neinhuis. C. Planta 1997, 202, 1-8.
2. Koch, K.; Bhushan, B.; Barthlott, W. Soft Matter 2008, 4, 1943-1963.
3. Ramaratnam, K.; Tsyalkovskv, V.; Klep, V.; Luzinov, I. Chem. Commun. 2007, (43), 4510-4512.
4. Lafuma, A.; Quere, D. Nat. Mater. 2003, 2(7), 457-160.
5. Quéré, D. Nat. Mater. 2002, 1, 14-15.
6. Gao, L.; McCarthy, T. J. Langmuir 2006, 22(7), 2966-2967.
7. Wier, K. A.; McCarthy, T. J. Langmuir 2006, 22(6), 2433-2436.
8. Sun, T.; Feng, L.; Gao, X.; Jiang, L. Acc. Chem. Res. 2005, 38(8), 644-652.
9. Callies, M.; Quéré, D. Sofi Matter 2005, 1, 55-61.
10. Blossey. R. Nat. Mater. 2003, 2, 301-306.
11. Gao, L.; McCarthy. T. J. Langmuir 2006, 22(14), 6234-6237.
12. Han, W.; Wu, D.; Ming, W.; Niemantsverdriet, J. W.; Thune, P. C. Langmuir 2006, 22(19). 7956-7959.
13. Feng. B. L.; Li. S.; Li, Y.; Li, H.; Zhang. L.; Zhai, J.; Song, Y.; Liu, B.; Jiang, L.; Zhu, D. Adv. Mater. 2002, 14(24), 1857-1860.
14. Shirtcliffe.N. J.; McHale, G.; Newton.M. I.; Perry, C. C. Langmuir 2003, 19(14), 5626-5631.
15. Zhai, L.; Cebeci, F. C.; Cohen. R. E.; Rubner, M. F. Nano Lett. 2004, 4(7), 1349-1353.
16. Han, J. T.; Xu, X. R.; Cho, K. Langmuir 2005, 21(15), 6662-6665.
17. Ming, W.; Wu, D.; vanBenthem, R.; deWith. G. Nano Lett. 2005, 5(11), 2298-2301.
18. Wu, X.; Shi, G. Nanotechnology 2005, 16(10), 2056-2060.
19. Zhang, X.-T.; Sato, O.; Fujishima, A. Langmuir 2004, 20(14), 6065-6067.
20. Xie, Q.; Fan, G.; Zhao, N.; Guo, X.; Xu, J.; Dong, J.; Zhang, L.; Zhang, Y.; Han, C. C. Adv. Mater. 2004, 16, 1830-1833.
21. Shi, F.; Chen, X.; Wang. L.; Niu, J.; Yu, J.; Wang. Z.; Zhang, X. Chem. Mater. 2005, 77(24), 6177-6180.
22. Li, Y.; Cai, W.; Cao, B.; Duan, G.; Sun, F.; Li, C.; Jia, L. Nanotechnology 2006, 17, 238-243.
23. J. Ji, J. F.; Shen, J. Adv. Mater. 2006, 18(11), 1441-1444.
24. Vogelaar, L.; Lammertink, R. G. H.; Wessling. M. Langmuir 2006, 22(7), 3125-3130.
25. Zhang, L.; Zhou, Z.; Cheng, B.; DeSimone, J. M.; Samulski, E. T. Langmuir 2006, 22(20), 8576-8580.
26. Ma, M.; Hill, R. M. Curr. Opin. Colloid Interface Sci. 2006, 11, 193-202.
27. Lau, K. K. S.; Bico, J.; Teo, K. B. K.; Chhowalla, M.; Amaratunga, G. A. J.; Milne, W. I.; McKinley. G. H.; Gleason. K. K. Nano Lett. 2003, 3(12), 1701-1705.
28. Minko, S.; Muller, M.; Motornov, M.; Nitschke, M.; Grundke, K.; Stamm, M. J. Am. Chem. Soc. 2003, 125(13), 3896-3900.
29. Cheng, Y. T.;Rodak. D. E.; Wong, C. A.; Hayden, C. A. Nanotechnology 2006, 17(5), 1359-1362.
30. Zhao, N.; Xu, J.; Xie, Q.; Weng, L.; Guo, X.; Zhang, X.; Shi, L. Macromol. Rapid Commun. 2005, 26, 1075-1080.
31. Taurino, R.; Fabbri, E.; Messori, M.; Pilati, F.; Pospiech, D.; Synytska, A. J. Colloid Interface Sci. 2008, 325(1), 149.
32. Wenzel, R. N. J. Phyys. Colloid Chem. 1949, 53(9), 1466-1467.
33. Oner, D.; McCarthy, T. J. Langmuir 2000, 16, 7777-7782.
34. Chen, W.; Fadeev, A. Y.; Hsieh, M. C.; Oner, D.; Youngblood, J.; McCarthy, T. J. Langmuir 1999, 15(10), 3395-3399.
35. Cassie, A. B. D.; Baxter, S. Trans. Faraday Soc. 1944, 40, 546-551.
36. Marmur, A. Langmuir 2003, 19(20), 8343-8348.
37. Johnson, R. E.; Dettre, R. H. In Contact Angle Hysteresis. I Study of Idealized Rough Surfaces; Gould, R. F., Ed.; Advances in Chemistry Series, Vol. 43; American Chemical Society; Washington. DC, 1964; pp 112-135.
38. Öner, D.; McCarthy. T. J. Langmuir 2000, 16, 7777-7782.
39. Shibuichi, S.; Onda. T.; Satoh. N.; Tsujii. K. J. Phys. Chem. 1996, 100, 19512-19517.
40. Onda, T.; Shibuichi. S.; Satoh, N.; Tsujii, K. Langmuir 1996, 12(9). 2125-2127.
41. Shibuichi, S.; Yamamoto, T.; Onda, T.; Tsujii, K. J. Colloid Interface Sci. 1998, 208, 287-294.
42. Synvtska. A.; Ionov. L.; Dutschk. V.; Stamm. M.; Grundke. K. Langmuir 2008, 24(20), 11895-11901.
43. Synytska, A.; Ionov, L.; Dutschk, V.;Minko,S.; Eichhorn,K.-J.; Stamm. M.; Grundke, K. Prog. Colloid Polym. Sci. 2006, 132, 72-81.
44. Synytska, A. Ph.D. Thesis, Technische Universität Dresden, 2005.
45. Spelt, J. K.; Neumann, A. W. Langmuir 1987, 3(4), 588-591.
46. We note that the experimentally measured value of the roughness factor is usually underestimated due to the resolution limits of Micro Glider.
47. Because the width of the light beam used in Micro Glider is about 1-2 μm, Micro Glider revealed a "smoothed"' topography where 200 nm particles are not resolved.
48. s = 1.9).
49. Dettre, R. H.; Johnson, R. E. In Contact Angle Hysteresis. II. Contact Angle Measurements on Rough Surfaces; Gould, R. F., Ed.; Advances in Chemistry Series. Vol. 43; American Chemical Soeietv: Washington, DC, 1964; pp 136-144.