Optical system invariant to second-order aberrations

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 26, Issue 4, 2009, Pages 977-984

  Samokhin, Alexander B ^a   Simonov, Aleksey N ^b   Rombach, Michiel C ^b  

^a MIREA RUSSIAN TECHNOLOGICAL UNIVERSITY   (Russian Federation)

^b Akkolens International BV   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CHROMATOGRAPHIC ANALYSIS; OPTICAL SYSTEMS; OPTICAL TRANSFER FUNCTION; OPTOELECTRONIC DEVICES; TWO DIMENSIONAL;

ANALYTICAL EXPRESSIONS; PHASE MASKS; PUPIL FUNCTIONS; PUPIL PLANES; SECOND-ORDER ABERRATIONS; SMOOTH FUNCTIONS; SPATIAL FREQUENCIES; STATIONARY PHASE METHODS; THIRD ORDERS;

FUNCTIONS;

EID: 65249106577     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.26.000977     Document Type: Article

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