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Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

(6) Naganuma, Hiroshi a,c Kovacs, Andras b,d Harima, Tetsuro a Shima, Hiromi a Okamura, Soichiro a Hirotsu, Yoshihiko b

a TOKYO UNIVERSITY OF SCIENCE (Japan)

b OSAKA UNIVERSITY (Japan)

c TOHOKU UNIVERSITY (Japan)

d RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTION DEPOSITIONS; COMPRESSIVE STRAINS; CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPIES; LATTICE PARAMETERS; SRTIO3 SUBSTRATES; TEM; TEM OBSERVATIONS; X-RAY DIFFRACTIONS; XRD;

CHEMICALS; EPITAXIAL FILMS; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

SUBSTRATES;

EID: 65249099724 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3074096 Document Type: Article

Times cited : (4)

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