Direct observation of magnetic gradient in Co/Pd pressure-graded media

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Kirby, B J ^a   Watson, S M ^a   Davies, J E ^a   Zimanyi, G T ^b   Liu, Kai ^b   Shull, R D ^a   Borchers, J A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CO/PD MULTILAYERS; COERCIVITY; CONTROL SAMPLES; DEPOSITION PRESSURES; DIRECT OBSERVATIONS; DISCRETE STEPS; GRADED MEDIAS; MAGNETIC DEPTH PROFILES; MAGNETIC GRADIENTS; MAGNETIC PROFILES; MULTI-LAYER STRUCTURES; POLARIZED NEUTRON REFLECTOMETRY; PRESSURE REGIONS; UNIFORM PRESSURES;

DEPTH PROFILING; ELECTRODEPOSITION; HYSTERESIS; HYSTERESIS LOOPS; MAGNETIC MULTILAYERS; MAGNETIC PROPERTIES; MAGNETISM; MAGNETOMETERS; MAGNETS; NEUTRON DIFFRACTION;

SATURATION MAGNETIZATION;

EID: 65249089868     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3077224     Document Type: Article

References (17)

1. R. Skomski and J. M. Coey, Phys. Rev. B 0163-1829 10.1103/PhysRevB.48. 15812 48, 15812 (1993).
2. E. F. Kneller and R. Hawig, IEEE Trans. Magn. 0018-9464 10.1109/20.102931 27, 3588 (1991).
3. R. H. Victora and X. Shen, IEEE Trans. Magn. 0018-9464 10.1109/TMAG.2005.855263 41, 2828 (2005).
4. J. S. Jiang, E. E. Fullerton, M. Grimsditch, C. H. Sowers, and S. D. Bader, J. Appl. Phys. 0021-8979 10.1063/1.367769 83, 6238 (1998).
5. Y. Choi, J. S. Jiang, and J. E. Pearson, Appl. Phys. Lett. 0003-6951 10.1063/1.2752534 91, 022502 (2007).
6. D. Suess, Appl. Phys. Lett. 0003-6951 10.1063/1.2374863 89, 189901 (2006).
7. J. E. Davies, O. Hellwig, E. E. Fullerton, G. Denbeaux, J. B. Kortright, and K. Liu, Phys. Rev. B 0163-1829 10.1103/PhysRevB.70.224434 70, 224434 (2004).
8. See: http://www.ncnr.nist.gov/instruments/ng1refl.
9. G. P. Felcher, Phys. Rev. B 0163-1829 10.1103/PhysRevB.24.1595 24, 1595 (1981).
10. C. F. Majkrzak, Physica B 0921-4526 10.1016/0921-4526(95)00948-5 221, 342 (1996).
11. G. L. Squires, Contemp. Phys. 0010-7514 10.1080/00107517608226175 17, 411 (1976).
12. S. M. Watson, T. Hauet, J. A. Borchers, S. Mangin, and E. E. Fullerton, Appl. Phys. Lett. 0003-6951 10.1063/1.2936836 92, 202507 (2008).
13. P. A. Kienzle, M. Doucet, D. J. McGillivray, K. V. O'Donovan, N. F. Berk, and C. F. Majkrzak, see http://www.ncnr.nist.gov/reflpak for documentation.
14. For reflectometry, the resolvable length scale roughly scales as 2π divided by the maximum Q value, and for a superlattice, the Q position of the first Bragg peak appears at 2π divided by the layer repeat thickness. Given the available Q range for these measurements, our data are totally insensitive to the contrast between the subnanometer Co and Pd layers, and do not reach far enough to access a superlattice Bragg peak.
15. 1 kA/m=1 emu/ cm3.
16. Models which constrain the multipressure samples to have uniform magnetic depth profiles were examined and found to result in significantly worse fits to the data.
17. M. S. Pierce, C. R. Buechler, L. B. Sorensen, J. J. Turner, S. D. Kevan, E. A. Jagla, J. M. Deutsch, T. Mai, O. Narayan, J. E. Davies, K. Liu, J. Hunter Dunn, K. M. Chesnel, J. B. Kortright, O. Hellwig, and E. E. Fullerton, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.94.017202 94, 017202 (2005).