Nanoscale characterization of wood photodegradation using atomic force microscopy

European Journal of Wood and Wood Products

Volumn 67, Issue 2, 2009, Pages 229-231

  Meincken, Martina ^a   Evans, Philip D ^b  

^a STELLENBOSCH UNIVERSITY   (South Africa)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC-FORCE MICROSCOPIES; FILMS AND COATINGS; IMAGE MATERIALS; NANO-METER SCALE; NANO-SCALE CHARACTERIZATIONS; NATURAL WEATHERINGS; QUANTITATIVE INFORMATIONS; SURFACE ENERGIES; UV RADIATIONS;

ATOMS; PHOTODEGRADATION; POLYMER FILMS; SOLAR ENERGY; SUN; SURFACE CHEMISTRY; SURFACE PROPERTIES; SURFACE TENSION; ULTRAVIOLET RADIATION;

ATOMIC FORCE MICROSCOPY;

EID: 65149100229     PISSN: 00183768     EISSN: 1436736X     Source Type: Journal    
DOI: 10.1007/s00107-008-0305-x     Document Type: Article

References (3)

1. S Biggs CA Lukey G Spinks S-T Yau 2001 An atomic force microscopy study of weathering of polyester/melamine paint surfaces Prog Org Coat 42 49 58
2. PD Evans 1988 A note on assessing the deterioration of thin wood veneers during weathering Wood Fiber Sci 20 487 492
3. Morris VJ, Kirby AR, Gunning AP (1999) Atomic Force Microscopy for Biologists. Imperial College Press, London, p 352