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Volumn 79, Issue 14, 2009, Pages

Direct visualization of magnetic vortex pinning in superconductors

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[No Author keywords available]

Indexed keywords


EID: 65149094353     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.144501     Document Type: Article
Times cited : (9)

References (63)
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    • In our scanning Hall-probe microscope a scanning tunneling microscope (STM) tip and a Hall probe are integrated in the same chip. The STM tip is used to approach the Hall probe to the sample surface, i.e., the tip is in contact with the surface when a tunneling current is detected. This approach is made on top of the highest point of the sample (top-right corner in our images). In a lift-off mode operation the STM tip is retracted at a certain distance (lift-off distance) from the sample surface. Since the Hall probe is located 15 μm behind the STM tip, the distance between the Hall probe and the sample surface is larger than the lift-off distance. In our case we estimate a tilt angle of ∼3°. Therefore, since during the experiments the lift off is 200 nm the distance between the Hall sensor and the sample is ∼1 μm at the approaching point. This separation increases as the image is scanned
    • In our scanning Hall-probe microscope a scanning tunneling microscope (STM) tip and a Hall probe are integrated in the same chip. The STM tip is used to approach the Hall probe to the sample surface, i.e., the tip is in contact with the surface when a tunneling current is detected. This approach is made on top of the highest point of the sample (top-right corner in our images). In a lift-off mode operation the STM tip is retracted at a certain distance (lift-off distance) from the sample surface. Since the Hall probe is located 15 μm behind the STM tip, the distance between the Hall probe and the sample surface is larger than the lift-off distance. In our case we estimate a tilt angle of ∼3°. Therefore, since during the experiments the lift off is 200 nm the distance between the Hall sensor and the sample is ∼1 μm at the approaching point. This separation increases as the image is scanned, giving rise to a decrease in contrast in the images from top to bottom. For more details see S. J. Bending, Adv. Phys. 48, 449 (1999). 10.1080/000187399243437
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    • Micromagnetic simulations are performed with a public available code from NIST
    • Micromagnetic simulations are performed with a public available code from NIST (http://math.nist.gov/oommf).
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    • Note that this is an approximate estimate.
    • Note that this is an approximate estimate.
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    • The bright edges of the square microring shown in Fig. 3 are due to the charging effects during the acquisition of the image with SEM.
    • The bright edges of the square microring shown in Fig. 3 are due to the charging effects during the acquisition of the image with SEM.
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    • In a decoration experiment regions with positive and negative out-of-plane local magnetic fields are not distinguished from each other since the decoration particles are sensitive to the field gradient independently of the field direction.
    • In a decoration experiment regions with positive and negative out-of-plane local magnetic fields are not distinguished from each other since the decoration particles are sensitive to the field gradient independently of the field direction.
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    • In order to determine the location of the square rings an out-of-plane field of the order of 5000 Oe was applied after doing the FC experiments in the as-grown state. Subsequently a SHPM image was taken where the square rings appear as bright spots due to the finite out-of-plane component of the magnetization.
    • In order to determine the location of the square rings an out-of-plane field of the order of 5000 Oe was applied after doing the FC experiments in the as-grown state. Subsequently a SHPM image was taken where the square rings appear as bright spots due to the finite out-of-plane component of the magnetization.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.