Sharp edge wavelength filters utilizing multilayer photonic crystals

Optics Express

Volumn 17, Issue 8, 2009, Pages 6347-6356

  Ohtera, Yasuo ^a   Inoue, Yoshihiko ^b   Kawashima, Takayuki ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b Photonic Lattice Incorporated   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; CRYSTAL FILTERS; MULTILAYERS;

CUT-OFF CHARACTERISTIC; DECAY CONSTANTS; DIELECTRIC MULTILAYERS; LIGHT WAVE; MULTILAYER STRUCTURES; SHARP EDGES; STOP-BANDS; WAVELENGTH FILTERS;

OPTICAL MULTILAYERS;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; FILTRATION; INSTRUMENTATION; LIGHT; METHODOLOGY; PHOTON; RADIATION SCATTERING; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FILTRATION; LIGHT; MODELS, THEORETICAL; PHOTONS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY;

EID: 65149094020     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.006347     Document Type: Article

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