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Volumn 79, Issue 12, 2009, Pages

Spatially resolved low-frequency noise measured by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 65149091406     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.121309     Document Type: Article
Times cited : (8)

References (28)
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    • The PSD was calculated by fast Fourier transform using a Hamming window.
    • The PSD was calculated by fast Fourier transform using a Hamming window.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.