Performance evaluation of III-V double-gate n-mOSFETs

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2008, Pages 67-68

  Kim, Donghyun ^a   Krishnamohan, Tejas ^a,b   Saraswat, Krishna C ^a  

^a Stanford University   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 64949182839     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2008.4800737     Document Type: Conference Paper

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