Can the interband tunnel FET outperform Si CMOS?

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2008, Pages 73-74

  Zhang, Qin ^a   Seabaugh, Alan ^a  

^a University of Notre Dame   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 64849115310     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2008.4800740     Document Type: Conference Paper

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