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Volumn 81, Issue 7, 2009, Pages 2685-2687
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Determination of microamounts of hafnium in zirconium using inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry during their separation by ion exchange on diphonix chelating resin
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Author keywords
[No Author keywords available]
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Indexed keywords
CERTIFIED REFERENCE MATERIALS;
CHELATING RESINS;
INDUCTIVELY COUPLED PLASMA- MASS SPECTROMETRIES;
INDUCTIVELY COUPLED PLASMA-ATOMIC EMISSION SPECTROMETRIES;
INITIAL CONCENTRATIONS;
MATRIXES;
MICROAMOUNTS;
ZIRCALOY-4;
ATOMIC EMISSION SPECTROSCOPY;
HAFNIUM;
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;
ION EXCHANGE;
ION EXCHANGERS;
IONS;
MASS SPECTROMETERS;
PHOTORESISTS;
RESINS;
SEPARATION;
SPECTROMETRY;
SPECTRUM ANALYSIS;
ZIRCONIUM;
ZIRCONIUM ALLOYS;
ZIRCONIUM COMPOUNDS;
INDUCTIVELY COUPLED PLASMA;
HAFNIUM;
RESIN;
ZIRCONIUM;
ARTICLE;
ATOMIC EMISSION SPECTROMETRY;
ION EXCHANGE;
MASS SPECTROMETRY;
SEPARATION TECHNIQUE;
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EID: 64849084477
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac802601d Document Type: Article |
Times cited : (19)
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References (23)
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