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Volumn 16, Issue 2, 2009, Pages 167-169
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Depth-resolved observation of photoelastic effect by four-wave mixing microscopy
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Author keywords
Birefringence; Four wave mixing; Microscopy; Photoelastic effect
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Indexed keywords
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EID: 64749085766
PISSN: 13406000
EISSN: 13499432
Source Type: Journal
DOI: 10.1007/s10043-009-0028-1 Document Type: Article |
Times cited : (3)
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References (8)
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