Elemental analysis of light constituents in thin plastic films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 7, 2009, Pages 1158-1166

  El Masri, Y ^a   Heitz, Ch ^a   Keutgen, Th ^a   Dufauquez, C ^a   Prieels, R ^a   Van Mol, J ^a   Natowitz, J B ^b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Alpha and proton beams; Rutherford and resonant RBS and ERDA

Indexed keywords

ALPHA AND PROTON BEAMS; ANALYSIS OF LIGHT ELEMENTS; DRUG MATERIALS; ELEMENTAL ANALYSIS; HIGHLY SENSITIVES; RUTHERFORD AND RESONANT RBS AND ERDA; THIN PLASTIC FILMS;

CHEMICAL ELEMENTS; HELIUM; HYDROGEN; PLASTIC FILMS; PROTECTIVE COATINGS; PROTON BEAMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

PROTONS;

EID: 64649086531     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.02.055     Document Type: Article

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