Effects of Bi4Ti3O12 addition on the microstructure and dielectric properties of Mn-doped BaTiO3-based X8R ceramics

Journal of Alloys and Compounds

Volumn 476, Issue 1-2, 2009, Pages 414-419

  Jain, T A ^a   Chen, C C ^a   Fung, K Z ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Ferroelectrics; Scanning and transmission electron microscopy; Thermal analysis; X ray diffraction

Indexed keywords

CORE-SHELL GRAINS; CORE-SHELL STRUCTURES; DIELECTRIC CONSTANTS; FERROELECTRICS; GRAIN SIZES; MN-DOPED; MULTI-LAYER CERAMIC CAPACITORS; ROOM TEMPERATURES; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPES; SECOND PHASE; SECONDARY PHASE; SINTERING TEMPERATURES; TEM; TEMPERATURE CHARACTERISTICS; THERMAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPES; XRD ANALYSIS;

CAPACITORS; CERAMIC CAPACITORS; CERAMIC MATERIALS; CURIE TEMPERATURE; DIELECTRIC WAVEGUIDES; DIFFRACTION; DOPING (ADDITIVES); ELECTRON MICROSCOPES; ELECTRONS; GRAIN SIZE AND SHAPE; MANGANESE; MANGANESE COMPOUNDS; MICROSTRUCTURE; PERMITTIVITY; SCANNING; SCANNING ELECTRON MICROSCOPY; SINTERING; THERMOANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 64549162430     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.09.014     Document Type: Article

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