Measurements of DSC isothermal crystallization kinetics in amorphous selenium bulk samples

Journal of Alloys and Compounds

Volumn 476, Issue 1-2, 2009, Pages 348-351

  Abu Sehly, A A ^a   Alamri, S N ^a   Joraid, A A ^a  

^a TAIBAH UNIVERSITY   (Saudi Arabia)

Author keywords

Amorphous semiconductors; Differential scanning calorimetry; Isothermal study; Scanning electron microscopy

Indexed keywords

AMORPHOUS SELENIUMS; ANNEALING TEMPERATURES; AVRAMI EXPONENTS; BULK SAMPLES; ISOTHERMAL CONDITIONS; ISOTHERMAL CRYSTALLIZATION KINETICS; ISOTHERMAL STUDY; SCANNING ELECTRON MICROSCOPES; THREE-DIMENSIONAL GROWTHS; TWO-DIMENSIONAL GROWTHS;

ACTIVATION ENERGY; AMORPHOUS SEMICONDUCTORS; ANNEALING; CRYSTALLIZATION KINETICS; CRYSTALS; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPES; EPITAXIAL GROWTH; LASER INTERFEROMETRY; SCANNING ELECTRON MICROSCOPY; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR GROWTH; THREE DIMENSIONAL;

SCANNING;

EID: 64549137642     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.08.059     Document Type: Article

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