Electron emission characteristics of MgO thin films used for ac-PDPs: Part I. Secondary electron emission

Electronic Materials Letters

Volumn 4, Issue 3, 2008, Pages 113-129

  Kim, Yong Seog ^a   Yoon, Sang Hoon ^a   Ahn, Seok Geun ^a   Hong, Cho Rong ^a   Yang, Heesun ^a  

^a Hong Ik University   (South Korea)

Author keywords

ac PDPs; Glow discharge; MgO; Secondary electron emission

Indexed keywords

EID: 64549135295     PISSN: 17388090     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (54)

1. R. H. Wilson, "A capacitively coupled bistable gas discharge cell for computer controlled display," Univ. Illinois, Urbana-Champaign, Coordinated Sci. Lab. Rep. R-303 (1996).
2. D. L. Bitzer, H. G. Slottow, and R. H. Wilson, U.S. Patent # 3, 559, 190 (1971).
3. W. Siemens, Poggendorff's Ann. Phys. Chem. 102, 66 (1857).
4. H. Uchiike, N. Nakayama, and M. Ohsawa, Proc. Int. Electron Devices Meeting, p. 191, Washington D.C. (1973).
5. H. S. Uhm, E. H. Choi and G. S. Cho, Appl. Phys. Lett. 78, 592 (2001).
6. R. Ganter, Th. Callergari, L. C. Pitchford, and J. P. Boeuf, Appl. Surf. Sci. 192, 299 (2002).
7. K. Yoshikawa, Y. Kanazawa, M. Wakitani, T. Shinoda, and O. Ohtsuka, Japan Display Int. Display Res. Conf., p. 605, Hiroshima, Japan (1992).
8. M. Amatsuchi, A. Hirota, H. Lin, T. Naoi, E. Otani, H. Taniguchi, and K. Amemiya, IDW'05 Tech. Digest, p. 435 (2005).
9. T. Shiga, T. Mori, A. Saito, and S. Mikoshiba, SID'05 Tech. Digest, p. 1248 (2005).
10. L. F. Weber, US Patent # 6, 184, 848 (2001).
11. H. Tonlner, IDW'04 Tech. Digest, p. 921 (2004).
12. V. P. Nagorny, V. N. Khudik, and A. A. Shvydky, IEEE Trans. Plasma Sci. 34, 343 (2006).
13. Q. Yan, N. Kosugi, Y. Oe, H. Tachibana, and L. F. Weber,IDW'06 Tech. Digest, p. 359 (2006).
14. T. Sakashita, T. Shiga, and S. Mikoshiba, IDW'06 Tech. Digest, p. 1143 (2006).
15. H. S. Uhm, N. Yoo and E. H. Choi, Phys. Plasmas 14, 043501 (2007).
16. L. Malter, Phys. Rev. B 50, 48 (1936).
17. J. Kramer, Der Metallische Zustand, Vandenhoeck u. Ruprecht, Goettingen (1950).
18. P. A. Redhead, J. Vac. Sci. Technol. A 16, 1394 (1998).
19. A. Einstein, Annalen der Physik 17, 132 (1905).
20. C. Lushchik, A. Lushchik, T. Kyarner, M. Kirm, and S. Dolgov, Russ. Phys. J. 43, 171 (2000).
21. Y. Chen, E. Montesa, J. L. Boldu and M. M. Abraham, Phys. Rev. B 24, 5 (1981).
22. V. M. Orera and Y. Chen, Phys. Rev. B 36, 5576 (1987).
23. G. H. Rosenblatt, R. W. Rowe, G. P. Williams, Jr., R. T. Williams, and Y. Chen, Phys. Rev. B 39, 10309 (1989)
24. B. T. Jeffries, R. Gonzalez, Y. Chen, and G. P. Summers, Phys. Rev. B 25, 2077 (1982)
25. M. A. Monge, R. Gonzalez, J. E. Munoz Santiuste, R. Pareja, Y. Chen, E. A. Kotomin, and A. I. Popov, Nucl. Instrum. Methods Phys. Res. Sect. B 166-167, 220 (2000).
26. D. Sempolinski, W. D. Kingery, and H. L. Tuller, J. Am. Ceram. Soc. 63, 669 (1980).
27. J. Fontanella, C. Andeen, and D. Schuele, Appl. Phys. Lett. 45, 2852 (1974).
28. K. Kanaya, S. Ono, and F. Ishigaki, J. Phys. D 11, 2425 (1978).
29. J. Portiera, G. Campeta, C. W. Kwona, J. Etourneaua, M. A. Subramanianb, Int. J. Inorg. Mater. 3, 1091 (2001).
30. R. C. Whited, C. J. Flaten, and W. C. Walker, Solid State Commun. 13, 1903 (1973).
31. B. Ulrici, W. Ulrici, and N. N. Kovalev, Sov. Phys. Sol. St. 17, 2305 (1975).
32. M. O. Aboelfotoh and J. A. Lorenzen, J. Appl. Phys. 48, 4754 (1977).
33. V. I. Avdeev and G. M. Zhidomirov, J. Struct. Chem. 44, 918 (2003).
34. K. Y. Tsou and E. B. Hensley, J. Appl. Phys. 45, 47 (1979).
35. J. Yamashita, Phys. Rev. B 111, 733 (1958).
36. J. R. Stevenson and E. B. Hensley, J. Appl. Phys. 32, 166 (1961).
37. N. D. Lang and W. Kohn, Phys. Rev. B 3, 1215 (1971).
38. P. Riccardi, M. Ishimoto, P. Barone, and R. A. Baragiola, Surf. Sci. 571, L305 (2004).
39. F. J. Himpsel, J. A. Knapp, J.A. VanVechten, and D. E. Eastman, Phys. Rev. B 20, 624 (1979).
40. Y.-M Chiang, D. B. Birnie III, and W. D. Kingery, Physical Ceramics, p. 109, John Wiley & Sons, New York (1997).
41. th ed., p. 292, Pergamon Press, Oxford (1979).
42. B. Henderson and J. E. Wertz, Defects in the Alkaline Earth Oxides, p. 4, Taylor & Francis LTD, London (1977).
43. Y.-M Chiang, D. B. Birnie III, and W. D. Kingery, Physical Ceramics, p. 129, John Wiley & Sons, New York (1997).
44. G. P. Summers, T. M. Wilson, B. T. Jeffries, H. T. Tohver, Y. Chen and M. M. Abraham, Phys. Rev. B 27, 1283 (1983).
45. nd ed., p. 33, Addison-Wesley, Reading, MA (1989).
46. B. Henderson and J. E. Wertz, Defects in the Alkaline Earth Oxides, p. 5, Taylor & Francis LTD, London (1977).
47. Y.-M Chiang, D. B. Birnie III, and W. D. Kingery, Physical Ceramics, p. 158, John Wiley & Sons, New York (1997).
48. G. Pacchioni and P. Pescarmona, Surf. Sci. 412-413, 657 (1998).
49. J. Kramer, W. Ernst, C. Tegenkamp, and H. Hfnuer, Surf. Sci. 517, 87 (2002).
50. H. Ebel, R. Svagera, and M. F. Ebel, Adv. X-Ray Anal. 43, 519 (2000).
51. H. D. Hagstrum, Phys. Rev. B 122, 83 (1961).
52. To be published
53. Y. Motoyama, H. Matsuzaki, and H. Murakami, IEEE Trans. Electron Devices 48, 1568 (2001).
54. G. Oversluizen, T. Dekker, M. F. Gillies, and S. T. de Zwart, J. Soc. Inf. Display 12, 51 (2004).