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Volumn , Issue , 2008, Pages 775-780

Automatic defects classification with p-median clustering technique

Author keywords

Automatic defect classification; Clustering; Content based image retrieval; Semiconductor manufacturing

Indexed keywords

AUTOMATIC DEFECT CLASSIFICATION; AUTOMATIC DEFECTS CLASSIFICATIONS; CLASSIFICATION FUNCTIONS; CLASSIFICATION METHODS; CLUSTERING; CLUSTERING TECHNIQUES; COMPARATIVE ANALYSIS; CONTENT-BASED IMAGE RETRIEVAL; DEFECT RECOGNITION; INSPECTION IMAGES; MANUFACTURING PROCESS; OFFLINE; P MEDIANS; REAL TIME; SEMICONDUCTOR INDUSTRIES; SEMICONDUCTOR MANUFACTURING; TEACHING PROCESS; TWO STAGES; VISION SYSTEMS;

EID: 64549117741     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICARCV.2008.4795615     Document Type: Conference Paper
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.