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Volumn , Issue , 2008, Pages
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Taking the next step in Moore's law: Designs turn to enable next technology node
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Author keywords
[No Author keywords available]
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Indexed keywords
ADVANCED TECHNOLOGIES;
COMPETITIVE ADVANTAGES;
IN PROCESS;
MANUFACTURING YIELDS;
MOORE'S LAWS;
NEW CLASS;
PARAMETRIC YIELDS;
PROCESS VARIABILITIES;
PRODUCT LAYOUTS;
PRODUCT PERFORMANCE;
RANDOM DEFECTS;
REQUIRED TIME;
SEMICONDUCTOR VENDORS;
SYSTEMATIC EFFECTS;
TECHNOLOGY NODES;
VOLUME PRODUCTIONS;
COMPETITION;
CONCURRENT ENGINEERING;
ELECTRON DEVICES;
TECHNOLOGY;
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EID: 64549099735
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IEDM.2008.4796711 Document Type: Conference Paper |
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Times cited : (2)
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References (0)
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