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Volumn , Issue , 2008, Pages 1620-1624

Fault diagnosis and modeling of the liquids packaging process. A research based on petri nets

Author keywords

Diagnoser; Discrete event systems; Faults diagnosis; Liquids packaging system; Petri nets

Indexed keywords

DIAGNOSER; DISCRETE EVENT SYSTEMS; DISCRETE EVENTS SYSTEMS; FAULT DIAGNOSIS; FAULTS DIAGNOSIS; INTERMITTENT FAULTS; MANUFACTURE INDUSTRIES; PACKAGING PROCESS; REAL PROCESS;

EID: 64549097539     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICARCV.2008.4795768     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 2
    • 64549107725 scopus 로고    scopus 로고
    • S.Chung and M. Jeng, Failure Diagnosis: A case Study on Modelling and Analysis by Petri Nets, IEEE, 2003.
    • S.Chung and M. Jeng, "Failure Diagnosis: A case Study on Modelling and Analysis by Petri Nets", IEEE, 2003.
  • 4
    • 33645346316 scopus 로고    scopus 로고
    • Descomposición Modular de Diagnosticadores de Fallos Basados en modelos de eventos discretos
    • Tesis Doctoral. junio
    • E. García, "Descomposición Modular de Diagnosticadores de Fallos Basados en modelos de eventos discretos" Tesis Doctoral. junio 2000.
    • (2000)
    • García, E.1
  • 6
    • 33847186246 scopus 로고    scopus 로고
    • Fault detection for discrete event systems using Petri Nets with unobservable transitions
    • Seville, Spain, December
    • A, Giua and C. Seatzu, "Fault detection for discrete event systems using Petri Nets with unobservable transitions", 44th IEEE Conference on Decision and Control, Seville, Spain, December 2005.
    • (2005) 44th IEEE Conference on Decision and Control
    • Giua, A.1    Seatzu, C.2
  • 7
    • 0024645936 scopus 로고
    • Petri Nets: Properties, Analysis and Applications
    • Apr
    • T. Murata, " Petri Nets: Properties, Analysis and Applications", in Proc. IEEE, Apr. 1989, Vol. 77, no. 4, pp. 541-580.
    • (1989) Proc. IEEE , vol.77 , Issue.4 , pp. 541-580
    • Murata, T.1
  • 12
    • 0032258770 scopus 로고    scopus 로고
    • T. Ushio, I Onishi and K. Okuda, Fault Detection Based on Petri Net models with Faulty Behaviors, IEEE, 1998
    • T. Ushio, I Onishi and K. Okuda, "Fault Detection Based on Petri Net models with Faulty Behaviors", IEEE, 1998


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.