Dielectric properties of the Bi(1.6-0.8x)YxTi 2O(6.4+0.3x) (0.03 (2) Kunej, Špela a Suvorov, Danilo a a JO EF STEFAN INSTITUTE (Slovenia)

Journal of the American Ceramic Society

Volumn 92, Issue 4, 2009, Pages 959-961

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; LOW DIELECTRIC LOSS; PYROCHLORE; ROOM TEMPERATURES; TEMPERATURE CO-EFFICIENT; X- RAY DIFFRACTIONS;

CERAMIC CAPACITORS; CHEMICAL ANALYSIS; CRYSTALLIZATION; DIELECTRIC LOSSES; DIELECTRIC WAVEGUIDES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SOLIDIFICATION;

SOLID SOLUTIONS;

EID: 64549096837     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.02995.x     Document Type: Article

References (15)

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