A new interscale and intrascale orthonormal wavelet thresholding for SURE-based Image denoising

IEEE Signal Processing Letters

Volumn 15, Issue , 2008, Pages 139-142

  Yan, Fengxia ^a   Cheng, Lizhi ^a   Peng, Silong ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b INSTITUTE OF AUTOMATION   (China)

Author keywords

Image denoising; Intrascale and interscale dependencies; Stein's unbiased risk estimator (SURE) minimization

Indexed keywords

DE-NOISING; HIGH FREQUENCY HF; IMAGE DENOISING; INTRASCALE AND INTERSCALE DEPENDENCIES; ORTHONORMAL WAVELETS; RECENT STATE; STEIN'S UNBIASED RISK ESTIMATOR (SURE) MINIMIZATION; UNBIASED RISK ESTIMATOR; WAVELET COEFFICIENTS;

ESTIMATION; IMAGE PROCESSING;

FREQUENCY ESTIMATION;

EID: 64549089980     PISSN: 10709908     EISSN: None     Source Type: Journal    
DOI: 10.1109/LSP.2007.914790     Document Type: Article

References (9)

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