Novel equivalent circuit model and statistical analysis in parameters identification

Solar Energy Materials and Solar Cells

Volumn 75, Issue 3-4, 2003, Pages 457-466

  Araki, Kenji ^a   Yamaguchi, Masafumi ^a  

^a TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

Curve fitting; Diode ideality factor; Equivalent circuit; Series resistance

Indexed keywords

ALGORITHMS; CURVE FITTING; DIODES; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBLEM SOLVING; SOLAR CELLS;

DIODE IDEALITY FACTORS;

EQUIVALENT CIRCUITS;

EID: 6444245145     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00204-0     Document Type: Article

References (3)

1. Aberle et al., A new method for accurate measurement of the lumped series resistance of solar cells, IEEE Photovoltaic Specialists Conference, 1993, pp. 133-139.
2. Nielsen L.D. Distributed series resistance effects in solar cells. IEEE. Trans. Electron Devices. 5(ED-29):1982;821-826.
3. Araki et al., AM0 Concentration Operation of III-V compounds solar cells, Proceedings of the 28th IEEE PVSC, Anchorage, USA, 2000.