Flow field effect on electric double layer during streaming potential measurements

Journal of Physical Chemistry B

Volumn 108, Issue 39, 2004, Pages 14970-14975

  Lu, Fuzhi ^a   Yang, Jun ^a   Kwok, Daniel Y ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; ELECTROLYTES; FINITE VOLUME METHOD; MATHEMATICAL MODELS; POISSON DISTRIBUTION;

ELECTRIC DOUBLE LAYER (EDL); ELECTRO-OSMOTIC FLOW (EOF); ELECTROKINETIC EFFECTS; POTENTIAL DISTRIBUTIONS;

ELECTRIC FIELD EFFECTS;

EID: 6444238240     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp048277z     Document Type: Article

References (31)

1. Helmholtz, H. Wied. Ann. 1879, 7, 337.
2. Gouy, G. J. Phys. 1910, 9, 457.
3. Stern, O. Z. Elektrochem. 1924, 30, 508.
4. Bull, H. J. Phys. Chem. 1935, 39, 577.
5. Dubois, R.; Roberts, A. J. Phys. Chem. 1936, 40, 543.
6. Kanamaru, K. Chem. Abstr. 1931, 25, 3895.
7. Kim, K.; Fane, A.; M., N.; A., P.; W. R., B.; H., M. J. Membr. Sci. 1996, 116, 149-159.
8. Szymczyk, A.; Fievet, P.; Mullet, M.; Reggiani, J.; Pagetti, J. J. Membr. Sci. 1998, 143, 189-195.
9. Moyer, L.; Abramson, H. J. Gen. Physiol. 1936, 19, 727.
10. Schweiss, R.; Welzel, P. B.; Werner, C.; Knoll, W. Langmuir 2001, 17, 4304-4311.
11. Erickson, D.; Li, D.; Werner, C. J. Colloid Interface Sci. 2000, 232, 186.
12. Werner, C.; Körber, H.; Zimmermann, R.; Dukhin, S.; Jacobasch, H.-J. J. Colloid Interface Sci. 1998, 208, 329-346.
13. Werner, C.; Zimmermann, R.; Kratzmüller, T. Colloids Surfaces A 2001, 792, 205-213.
14. White, H.; Urban, F.; Krick, E. J. Phys. Chem. 1932, 36, 120.
15. Bull, H.; Gortner, R. J. Phys. Chem. 1932, 32, 111.
16. Rutgers, A.; de Smet, M. Trans. Faraday Soc. 1945, 41, 758.
17. Patanka, N. A.; Hu, H. Anal. Chem. 1998, 70, 1870.
18. Hu, L.; Harrison, J. D.; Masliyah, J. H. J. Colloid Interface Sci. 1999, 215, 300-312.
19. Ermakov, S. V.; Jacobson, S. C.; Ramsey, J. M. Anal. Chem. 1998, 70, 4494.
20. Mitchell, M. J.; Qiao, R.; Aluru, N. R. J. Microelectromech. Syst. 2000, 9, 435.
21. MacInnes, J. M. Chem. Eng. Sci. 2002, 57, 4539.
22. Yang, R.-J.; Pu, L.-M.; Hwang, C.-C. J. Colloid Interface Sci. 2001, 244, 173-179.
23. Theemsche, A.; Deconinck, J.; Bossche, B. V. D.; Bortels, L. Anal. Chem. 2002, 74, 4919.
24. Yang, J.; Masliyah, J. H.; Kwok, D. Y. Langmuir 2004, 3862-3871.
25. Wood, L. A. J. Am. Chem. Soc. 1946, 68, 432-437.
26. Yang, J.; Kwok, D. Y. Langmuir 2003, 19, 1047-1053.
27. Yang, J.; Kwok, D. Y. J. Micromech. Microeng. 2003, 13, 115-123.
28. Yang, J.; Kwok, D. Y. J. Chem. Phys. 2003, 118, 354-363.
29. Ren, L. Q.; Li, D.; Qu, W. L. J. Colloid Interface Sci. 2001, 233, 12-22.
30. Gu, Y.; Li, D. J. Colloid Interface Sci. 2000, 226, 328.
31. Hunter, R. Introduction to Modem Colloid Science; Oxford University Press Inc.: Oxford, 1993.