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Current Applied Physics

Volumn 5, Issue 1, 2005, Pages 9-14

Steady-state analysis for contact barrier effects in metal/organic/metal structure using numerical bipolar transport simulation

(6) Lee, Jung Ho a Park, No Gill a Kim, Young Sik a Suh, Chung Ha a Shim, Jae Hoon a Kim, Young Kwan a

a Hong Ik University (South Korea)

Author keywords

Contact barrier effect; Device simulation; OLED

Indexed keywords

EID: 6444235492 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2003.12.004 Document Type: Article

Times cited : (5)

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