Analysis of paint defects by mass spectroscopy (LAMMA®/ToF-SIMS)

Progress in Organic Coatings

Volumn 51, Issue 3, 2004, Pages 163-171

  Wolff, Ulrich ^a   Thomas, Hartmut ^a   Osterhold, Michael ^a  

^a DuPont de Nemours GmbH   (Germany)

Author keywords

Coating defects; LAMMA ; Surface analysis; ToF SIMS

Indexed keywords

COATINGS; ELECTRIC FIELDS; EPOXY RESINS; IONIZATION; MONOLAYERS; PROBABILITY; SECONDARY ION MASS SPECTROMETRY; SURFACE TENSION;

COATING DEFECTS; PAINT DEFECTS; SURFACE ANALYSIS; TARGET SURFACES;

PAINT;

EID: 6444226085     PISSN: 03009440     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.porgcoat.2004.07.006     Document Type: Article

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