Electrooptic ellipsometry study of piezoelectric BaTiO3-ZnO heterostructures

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1328-1331

  Voora, V M ^a   Hofmann, T ^a   Brandt, M ^b   Lorenz, M ^b   Grundmann, M ^b   Schubert, M ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASYMMETRIC HYSTERESIS; CHARGE COUPLING; DEPLETION LAYER; DOPED ZNO; EFFECTIVE INDEX OF REFRACTION; EFFECTIVE THICKNESS; FERROELECTRIC LAYERS; FERROELECTRIC POLARIZATION; HETEROSTRUCTURES; HYSTERESIS BEHAVIOR; PEROVSKITE STRUCTURES; PIEZOELECTRIC STRAIN; SPONTANEOUS POLARIZATIONS; WURTZITE STRUCTURE; ZNO; ZNO LAYERS;

BARIUM COMPOUNDS; FERROELECTRICITY; FILM THICKNESS; HETEROJUNCTIONS; HYSTERESIS; OXIDE MINERALS; PEROVSKITE; PIEZOELECTRICITY; PLATINUM; POLARIZATION; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; ZINC SULFIDE;

ZINC OXIDE;

EID: 64349110310     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777908     Document Type: Conference Paper

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