-
1
-
-
33751386104
-
-
Rapko, B. M.; Duesler, E. N.; Smith, P. H.; Paine, R. T.; Ryan, R. R. Inorg. Chem. 1993, 32, 2164.
-
(1993)
Inorg. Chem
, vol.32
, pp. 2164
-
-
Rapko, B.M.1
Duesler, E.N.2
Smith, P.H.3
Paine, R.T.4
Ryan, R.R.5
-
2
-
-
0001575101
-
-
Engelhardt, U.; Rapko, B. M.; Duesler, E. N.; Frutos, D.; Paine, R. T.: Smith, P. H. Polyhedron 1995, 14, 2361.
-
(1995)
Polyhedron
, vol.14
, pp. 2361
-
-
Engelhardt, U.1
Rapko, B.M.2
Duesler, E.N.3
Frutos, D.4
Paine, R.T.5
Smith, P.H.6
-
3
-
-
0035854912
-
-
Gan, X.; Duesler, E. N.; Paine, R. T. Inorg. Chem. 2001, 40, 4420.
-
(2001)
Inorg. Chem
, vol.40
, pp. 4420
-
-
Gan, X.1
Duesler, E.N.2
Paine, R.T.3
-
5
-
-
14044276220
-
-
Gan, X.; Rapko, B. M.; Duesler, E. N.; Binyamin, I.; Paine, R. T.: Hay, B. P. Polyhedron 2005, 24, 469.
-
(2005)
Polyhedron
, vol.24
, pp. 469
-
-
Gan, X.1
Rapko, B.M.2
Duesler, E.N.3
Binyamin, I.4
Paine, R.T.5
Hay, B.P.6
-
6
-
-
0037020825
-
-
Nash, K. L.; Lavalette, C; Borkowski, M.; Paine, R. T.; Gan, X. Inorg. Chem. 2002, 41, 5849.
-
(2002)
Inorg. Chem
, vol.41
, pp. 5849
-
-
Nash, K.L.1
Lavalette, C.2
Borkowski, M.3
Paine, R.T.4
Gan, X.5
-
7
-
-
64349123421
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-
In prior publications these compounds have been named as bis(pho-sphinomethyl)pyridine N,P,P'-trioxides. The nomenclature has been revised to meet current rules.
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In prior publications these compounds have been named as bis(pho-sphinomethyl)pyridine N,P,P'-trioxides. The nomenclature has been revised to meet current rules.
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-
-
-
8
-
-
0034502312
-
-
Bond, E. M.; Duesler, E. N.; Paine, R. T.; Nöth, H. Polyhedron 2000. 19, 2135.
-
(2000)
Polyhedron
, vol.19
, pp. 2135
-
-
Bond, E.M.1
Duesler, E.N.2
Paine, R.T.3
Nöth, H.4
-
9
-
-
64349122069
-
-
Matonic, J. H.; Neu, M. P.; Enriquez, A. E.; Paine, R. T.; Scott, B. L. Dalton Trans. 2002, 2328.
-
(2002)
Dalton Trans
, pp. 2328
-
-
Matonic, J.H.1
Neu, M.P.2
Enriquez, A.E.3
Paine, R.T.4
Scott, B.L.5
-
10
-
-
0030854964
-
-
Bond, E. M.; Engelhardt, U.; Deere, T. P.; Rapko, B. M.; Paine, R. T.; Fitzpatrick, J. R. Solυ. Extr. Ion Exch. 1997, 15, 381.
-
(1997)
Solυ. Extr. Ion Exch
, vol.15
, pp. 381
-
-
Bond, E.M.1
Engelhardt, U.2
Deere, T.P.3
Rapko, B.M.4
Paine, R.T.5
Fitzpatrick, J.R.6
-
11
-
-
0032123328
-
-
Bond, E. M.; Engelhardt, U.; Deere, T. P.; Rapko, B. M.; Paine, R. T.: Fitzpatrick, J. R. Solυ. Extr. Ion Exch. 1998, 16, 967.
-
(1998)
Solυ. Extr. Ion Exch
, vol.16
, pp. 967
-
-
Bond, E.M.1
Engelhardt, U.2
Deere, T.P.3
Rapko, B.M.4
Paine, R.T.5
Fitzpatrick, J.R.6
-
12
-
-
0032093829
-
-
Bond, E. M.; Gan, X.; FitzPatrick, J. R.; Paine, R. T. J. Alloys Compd. 1998, 271-273, 172.
-
(1998)
J. Alloys Compd
, vol.271-273
, pp. 172
-
-
Bond, E.M.1
Gan, X.2
FitzPatrick, J.R.3
Paine, R.T.4
-
13
-
-
84948320005
-
-
Horwitz, E. P.; Kalina, D. G.; Kaplan, L.; Mason, G. W.; Diamond. H. Sep. Sci. Technol. 1982, 17, 1261.
-
(1982)
Sep. Sci. Technol
, vol.17
, pp. 1261
-
-
Horwitz, E.P.1
Kalina, D.G.2
Kaplan, L.3
Mason, G.W.4
Diamond, H.5
-
14
-
-
0019624541
-
-
Kalina, D. G.; Horwitz, E. P.; Kaplan, L.; Muscatello, A. C. Sep. Sci. Technol. 1981, 16, 1127.
-
(1981)
Sep. Sci. Technol
, vol.16
, pp. 1127
-
-
Kalina, D.G.1
Horwitz, E.P.2
Kaplan, L.3
Muscatello, A.C.4
-
15
-
-
0000858669
-
-
Horwitz, E. P.; Muscatello, A. C; Kalina, D. G.; Kaplan, L. Sep. Sci. Technol. 1981, 16, 417.
-
(1981)
Sep. Sci. Technol
, vol.16
, pp. 417
-
-
Horwitz, E.P.1
Muscatello, A.C.2
Kalina, D.G.3
Kaplan, L.4
-
16
-
-
84948504969
-
-
Horwitz, E. P.; Kalina, D. G.; Muscatello, A. C. Sep. Sci. Technol. 1981, 16, 403.
-
(1981)
Sep. Sci. Technol
, vol.16
, pp. 403
-
-
Horwitz, E.P.1
Kalina, D.G.2
Muscatello, A.C.3
-
17
-
-
0035077532
-
-
Romanovskiy, V. N.; Smirnov, I. V.; Babain, V. A.; Todd, T. A.; Herbet, R. S.; Law, J. D.; Brewer, K. N. Solυ. Extr. Ion Exch. 2001, 19, 1.
-
(2001)
Solυ. Extr. Ion Exch
, vol.19
, pp. 1
-
-
Romanovskiy, V.N.1
Smirnov, I.V.2
Babain, V.A.3
Todd, T.A.4
Herbet, R.S.5
Law, J.D.6
Brewer, K.N.7
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18
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0035077533
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Law, J. D.; Herbst, R. S.; Todd, T. A.; Romanovskiy, V. N.; Babain, V. A.; Esimantovskiy, V. M.; Smirnov, I. V.; Zaitsev, B. N. Solυ. Extr. Ion Exch. 2001, 19, 23.
-
(2001)
Solυ. Extr. Ion Exch
, vol.19
, pp. 23
-
-
Law, J.D.1
Herbst, R.S.2
Todd, T.A.3
Romanovskiy, V.N.4
Babain, V.A.5
Esimantovskiy, V.M.6
Smirnov, I.V.7
Zaitsev, B.N.8
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19
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0036660953
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Herbst, R. S.; Law, J. D.; Todd, T. A.; Romanovskiy, V. N.; Babain, V. A.; Esimantovskiy, V. M.; Smirnov, I. V.; Zaitsev, B. N. Solυ. Extr. Ion Exch. 2002, 20, 429.
-
(2002)
Solυ. Extr. Ion Exch
, vol.20
, pp. 429
-
-
Herbst, R.S.1
Law, J.D.2
Todd, T.A.3
Romanovskiy, V.N.4
Babain, V.A.5
Esimantovskiy, V.M.6
Smirnov, I.V.7
Zaitsev, B.N.8
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Romanovskiy, V. N.; Babain, V. A.; Alyapyshev, M. Yu.; Smirnov, I. V.; Herbst, R. S.; Law, J. D.; Todd, T. A. Sep. Sci. Technol. 2006. 41, 2111.
-
(2006)
Sep. Sci. Technol
, vol.41
, pp. 2111
-
-
Romanovskiy, V.N.1
Babain, V.A.2
Alyapyshev, M.Y.3
Smirnov, I.V.4
Herbst, R.S.5
Law, J.D.6
Todd, T.A.7
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84869273526
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The crystallographic software used in these structure determinations include: Sheldrick, G.M., SHELXTL, v. 6.14; Broker Analytical X-ray Madison, WI, 2001; Sheldrick, G.M., SADABS, v. 2.10. Program for Empirical Absorption Correction of Area Detector Data, University of Göttingen:Göttingen, Germany, 2003, SAINTPlus, v. 7.01, Broker Analytical X-ray, Madison, WI, 2003.
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The crystallographic software used in these structure determinations include: Sheldrick, G.M., SHELXTL, v. 6.14; Broker Analytical X-ray Madison, WI, 2001; Sheldrick, G.M., SADABS, v. 2.10. Program for Empirical Absorption Correction of Area Detector Data, University of Göttingen:Göttingen, Germany, 2003, SAINTPlus, v. 7.01, Broker Analytical X-ray, Madison, WI, 2003.
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Frisch, M. J, Tracks, G. W, Schlegel, H. B, Scuseria, G. E, Robb, M, Cheeseman, J. R, Montgomery, J. A, Vreven, J. A, Kudin, K. N, Burant, J. C; Millam, J. M, Iyengar, S. S, Tomasi, J, Barone, V, Mennucci, B, Cossi, M, Scalmani, G, Rega, N, Petersson, G. A, Nakatsuji, H, Hada, M, Ehara, M, Toyota, K, Fukuda, R, Hasegawa, J, Ishida, M, Nakajima, T, Honda, Y, Kitao, O, Nakai, H, Klene. M, Li, X, Knox, J. E, Hratchian, H. P, Cross, J. B, Adamo, C; Jaramillo, J, Gomperts, R, Stratmann, R. E, Yazyev, O, Austin. A. J, Cammi, R, Pomelli, C; Ochterski, J. W, Ayala, P. Y, Morokuma, K, Voth, G. A, Salvador, P, Dannenberg, J. J, Zakrzewski, V. G, Dapprich, S, Daniels, A. D, Strain, M. C; Farkas, O, Malick, D. K, Rabuck, A. D, Raghavachari, K, Foresman, J. B, Ortiz, J. V, Cui, Q, Baboul, A. G, Clifford, S, Cioslowski, J, Stefanov, B. B, Liu, G, Liashenko, A, Piskorz, P, Komaromi, I, Martin, R. L, Fox, D. J, Keith, T, Al-Laham, M. A
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Frisch, M. J.; Tracks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M.; Cheeseman, J. R.; Montgomery, J. A.; Vreven, J. A.; Kudin, K. N.; Burant, J. C; Millam, J. M.; Iyengar, S. S.; Tomasi, J.; Barone, V.; Mennucci, B.; Cossi, M.; Scalmani, G.; Rega, N.; Petersson, G. A.; Nakatsuji, H.; Hada, M.; Ehara, M.; Toyota, K.; Fukuda, R.; Hasegawa, J.; Ishida, M.; Nakajima, T.; Honda, Y.; Kitao, O.; Nakai, H.; Klene. M.; Li, X.; Knox, J. E.; Hratchian, H. P.; Cross, J. B.; Adamo, C; Jaramillo, J.; Gomperts, R.; Stratmann, R. E.; Yazyev, O.; Austin. A. J.; Cammi, R.; Pomelli, C; Ochterski, J. W.; Ayala, P. Y.; Morokuma, K.; Voth, G. A.; Salvador, P.; Dannenberg, J. J.; Zakrzewski, V. G.; Dapprich, S.; Daniels, A. D.; Strain, M. C; Farkas, O.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.: Ortiz, J. V.; Cui, Q.; Baboul, A. G.; Clifford, S.; Cioslowski, J.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.: Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Gonzalez, C; Pople, G. A., Gaussian 03, Revision C.02; Gaussian, Inc.: Wallingford, CT, 2004.
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-
-
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64349093551
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Dennington, Roy, II; Keith, Todd; Millam, John; Eppinnett, Ken; Hovell, W. Lee; and Gilliland, Ray; GaussView, Version 3.09; Semichem, Inc, Shawnee Mission, KS, 2003
-
Dennington, Roy, II; Keith, Todd; Millam, John; Eppinnett, Ken; Hovell, W. Lee; and Gilliland, Ray; GaussView, Version 3.09; Semichem, Inc.: Shawnee Mission, KS, 2003.
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-
-
-
31
-
-
84994437953
-
-
Casalnuovo, A. L.; RajanBabu, T. V.; Ayers, T. A.; Warren, T. H. J. Am. Chem. Soc. 1994, 116, 9869.
-
(1994)
J. Am. Chem. Soc
, vol.116
, pp. 9869
-
-
Casalnuovo, A.L.1
RajanBabu, T.V.2
Ayers, T.A.3
Warren, T.H.4
-
32
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64349118111
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NIST Standard Reference Data Program Collection, Origin: Sadtler Research Laboraories under US-EPA contract
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NIST Standard Reference Data Program Collection, Origin: Sadtler Research Laboraories under US-EPA contract.
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35
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84869275880
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An Unattributed compendium found on the website at
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An Unattributed compendium found on the website at www.bu.edu/ gale/analyses/nuPO-Data-File/nuPO%20data%20.
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-
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-
-
0034346815
-
-
Shvets, A. A.; Safaryan, G. P.; Shvets, S. A. Russ. J. Gen. Chem. 2000, 70, 1037.
-
(2000)
Russ. J. Gen. Chem
, vol.70
, pp. 1037
-
-
Shvets, A.A.1
Safaryan, G.P.2
Shvets, S.A.3
-
38
-
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64349085000
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NIST Standard Reference Data Program Collection, Origin: Coblentz (No. 10231).
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NIST Standard Reference Data Program Collection, Origin: Coblentz (No. 10231).
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-
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-
69949153143
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-
Szbyk, E.; Zhang, Z. Y.; Palenik, G. J.; Palenik, R. C; Colgate, S. O. Acta Crystallogr. 1989, C45, 1234.
-
(1989)
Acta Crystallogr
, vol.C45
, pp. 1234
-
-
Szbyk, E.1
Zhang, Z.Y.2
Palenik, G.J.3
Palenik, R.C.4
Colgate, S.O.5
-
42
-
-
20544433165
-
-
Boudi, J. Phys. Chem. 1964, 68, 441.
-
(1964)
J. Phys. Chem
, vol.68
, pp. 441
-
-
Boudi1
-
43
-
-
43949126843
-
-
Klaehn, J. R.; Peterman, D. R.; Harrap, M. K.; Tillotson, R. D.; Luther, T. A.; Law, J. D.; Daniels, L. M. Inorg. Chim. Acta 2008, 361, 2522.
-
(2008)
Inorg. Chim. Acta
, vol.361
, pp. 2522
-
-
Klaehn, J.R.1
Peterman, D.R.2
Harrap, M.K.3
Tillotson, R.D.4
Luther, T.A.5
Law, J.D.6
Daniels, L.M.7
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44
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84869275881
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For example F(l)/C(7)-P(l)-C(14), 112.65(6)°; F(4)/0(1)-P(l)-C(14). 111.82(6)°; F(7)/C(22)-P(2)-C(29), 113.61(7)°, F(10)/O(2)-P(2)-C(21), 111.83(7)°.
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For example F(l)/C(7)-P(l)-C(14), 112.65(6)°; F(4)/0(1)-P(l)-C(14). 111.82(6)°; F(7)/C(22)-P(2)-C(29), 113.61(7)°, F(10)/O(2)-P(2)-C(21), 111.83(7)°.
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45
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84869273527
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The H-bonding parameters for D-H···AO(4)-H(4A) ···0(3)#l are: D-H, 0.77(4)Å; H·· ·A, 1.95(4)Å; D···A, 2.713(3)Å; D-H-A. 171(4)°.
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The H-bonding parameters for D-H···AO(4)-H(4A) ···0(3)#l are: D-H, 0.77(4)Å; H·· ·A, 1.95(4)Å; D···A, 2.713(3)Å; D-H-A. 171(4)°.
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46
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84869272852
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If σ orbital effects dominate the electron distribution in these molecules, it would be expected that addition of CF3 substituents to the phenyl groups would result in withdrawal of electron density from the P=0 groups causing, for example, decreased basicity, downfield 31P NMR shifts and increased vPO. However, if one or more fluorine atoms associate with the back side of the P(V) center in solid and solution conditions, then this may offset some of this first order electron withdrawal. This would, in turn, offset shifts in 31P and VPO. Pi-electron shifts also certainly contribute in these molecules and further study will be required to provide a more detailed picture of the impacts of CF3 substituents on the bonding and spectra for these and related compounds
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PO. Pi-electron shifts also certainly contribute in these molecules and further study will be required to provide a more detailed picture of the impacts of CF3 substituents on the bonding and spectra for these and related compounds.
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