메뉴 건너뛰기




Volumn 112, Issue 5, 2009, Pages 3103-3109

Morphology-related packetlike space-charge behavior in linear low-density polyethylene doped with Al2O3 nanoparticles

Author keywords

Charge transport; Morphology; Nanocom posites; Polyethylene (PE)

Indexed keywords

APPARENT MOBILITIES; BLENDING PROCESS; CHARGE TRANSPORT; DIRECT CURRENT FIELDS; DIRECT CURRENTS; DOPED SAMPLES; DOPING CONCENTRATIONS; ISOTHERMAL DECAYS; LINEAR LOW-DENSITY POLYETHYLENES; MATRIX MATERIALS; NANOCOM-POSITES; PRESSURE WAVE PROPAGATION METHODS; SEMICONDUCTIVE; SHEET SAMPLES; SPACE CHARGES;

EID: 64249140967     PISSN: 00218995     EISSN: 10974628     Source Type: Journal    
DOI: 10.1002/app.29571     Document Type: Article
Times cited : (11)

References (22)
  • 4
    • 0035695818 scopus 로고    scopus 로고
    • See, A.; Dissado, L. A.; Fothergill, J. C. IEEE Trans DEI 2001, 8, 859.
    • See, A.; Dissado, L. A.; Fothergill, J. C. IEEE Trans DEI 2001, 8, 859.
  • 5
    • 28744439465 scopus 로고    scopus 로고
    • Jones, J. P.; Llewellyn, J. P.; Lewis, T. J. IEEE Trans DEI 2005, 12, 951.
    • Jones, J. P.; Llewellyn, J. P.; Lewis, T. J. IEEE Trans DEI 2005, 12, 951.
  • 6
    • 41949140066 scopus 로고    scopus 로고
    • Delpino, S.; Fabiani, D.; Montanari, G. C; Dissado, L. A.; Laurent, C; Teyssedre, G. In Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena, Vancouver, British Columbia, Canada, Institute of Electrical and Electronics Engineers (IEEE), New York, NY, 2007; p 421.
    • Delpino, S.; Fabiani, D.; Montanari, G. C; Dissado, L. A.; Laurent, C; Teyssedre, G. In Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena, Vancouver, British Columbia, Canada, Institute of Electrical and Electronics Engineers (IEEE), New York, NY, 2007; p 421.
  • 7
    • 51249097498 scopus 로고    scopus 로고
    • Dissado, L. A.; Zadeh, S.; Fothergill, J. C; See, A. In Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena, Vancouver, British Columbia, Canada, Institute of Electrical and Electronics Engineers (IEEE), New York, NY, 2007; p 425.
    • Dissado, L. A.; Zadeh, S.; Fothergill, J. C; See, A. In Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena, Vancouver, British Columbia, Canada, Institute of Electrical and Electronics Engineers (IEEE), New York, NY, 2007; p 425.
  • 8
    • 64249108606 scopus 로고    scopus 로고
    • Maezawa, T.; Talma, J.; Hayase, Y.; Tanaka, Y.; Takada, T.; Sekiguehi, Y.; Murata, Y. In Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena, Vancouver, British Columbia, Canada, Institute of Electrical and Electronics Engineers (IEEE), New York, NY, 2007; p 271.
    • Maezawa, T.; Talma, J.; Hayase, Y.; Tanaka, Y.; Takada, T.; Sekiguehi, Y.; Murata, Y. In Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena, Vancouver, British Columbia, Canada, Institute of Electrical and Electronics Engineers (IEEE), New York, NY, 2007; p 271.
  • 21
    • 64249132881 scopus 로고    scopus 로고
    • Gong, B.; Zhang, Y.; Zheng, F.; Xiao, C; Wu, C. Chin J Mater Sci Technol 2006, 24, 109.
    • Gong, B.; Zhang, Y.; Zheng, F.; Xiao, C; Wu, C. Chin J Mater Sci Technol 2006, 24, 109.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.