Introduction to the special issue on GaN and related nitride compound device reliability

IEEE Transactions on Device and Materials Reliability

Volumn 8, Issue 2, 2008, Pages 239-

  Christou, Aris ^a   Fantini, Fausto ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

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[No Author keywords available]

Indexed keywords

EID: 64249114540     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2008.925989     Document Type: Editorial

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