|
|
Volumn 404, Issue 8-11, 2009, Pages 1450-1464
|
|
Spectroscopic and dielectric properties of ZnF2-As2O3-TeO2 glass system doped with V2O5
|
|
Author keywords
Dielectric properties; Spectroscopic properties; Vanadium ions; ZnF2 As2O3 TeO2 glass system
|
|
Indexed keywords
AC CONDUCTIONS;
AC CONDUCTIVITIES;
BROAD EMISSION BANDS;
CONCENTRATION OF;
DIELECTRIC PARAMETERS;
ELECTRON SPIN RESONANCES;
ESR SPECTRUM;
GLASS NETWORKS;
IR SPECTRUM;
LUMINESCENCE EFFICIENCIES;
LUMINESCENT EMISSIONS;
OPTICAL ABSORPTIONS;
ROOM TEMPERATURES;
SPECTROSCOPIC PROPERTIES;
STRUCTURAL DISORDERS;
STRUCTURAL GROUPS;
TUNNELING PHENOMENON;
VANADIUM IONS;
WAVELENGTH RANGES;
X- RAY DIFFRACTIONS;
ZNF2-AS2O3-TEO2 GLASS SYSTEM;
ABSORPTION;
ACTIVATION ENERGY;
CERAMIC CAPACITORS;
CONCENTRATION (PROCESS);
DIELECTRIC MATERIALS;
DIELECTRIC PROPERTIES;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
EMISSION SPECTROSCOPY;
GLASS;
INFRARED SPECTROSCOPY;
INTEGRATED OPTOELECTRONICS;
IONS;
LIGHT;
LIGHT ABSORPTION;
LUMINESCENCE;
OPTICAL CONDUCTIVITY;
SCANNING ELECTRON MICROSCOPY;
SPIN DYNAMICS;
TANNING;
TERNARY SYSTEMS;
TRANSITION METALS;
VANADIUM;
VANADIUM ALLOYS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
|
|
EID: 64149111119
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2008.12.040 Document Type: Article |
|
Times cited : (40)
|
|
References (43)
|
