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Volumn 40, Issue 12, 2008, Pages 34-36
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Part 30-statistically derived detection limits (concluded)
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION PLOTS;
CONCENTRATION UNITS;
CONFIDENCE LEVELS;
DETECTION LIMITS;
LOWER LIMITS;
PEAK AREAS;
REAL-WORLD DATUM;
REGRESSION LINES;
UPPER LIMITS;
SULFUR COMPOUNDS;
TRACE ANALYSIS;
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EID: 63849343714
PISSN: 00447749
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (0)
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