Improved performance of spherical BaWO4:Tb3+ phosphors for field-emission Displays

Journal of the Electrochemical Society

Volumn 156, Issue 5, 2009, Pages

  Li, H L ^a   Wang, Z L ^a   Xu, S J ^b   Hao, J H ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CATHODOLUMINESCENCE; ELECTRON BEAMS; EMISSION SPECTROSCOPY; FIELD EMISSION DISPLAYS; FOURIER TRANSFORMS; PHOSPHORS; SCANNING ELECTRON MICROSCOPY; SPHERES; TRANSMISSION ELECTRON MICROSCOPY;

AVERAGE PARTICLE SIZES; AVERAGE SIZES; CHARACTERISTIC EMISSIONS; CRYSTALLINITY; FIELD EMISSION-SCANNING ELECTRON MICROSCOPIES; IR SPECTRUM; LOW VOLTAGES; PHOTOLUMINESCENCE SPECTRUM; POLYOL METHODS; POST-ANNEALING TREATMENTS; POSTANNEALING; SPHERICAL PARTICLES; SYNTHESIS TEMPERATURES; X- RAY DIFFRACTIONS;

LIGHT EMISSION;

EID: 63649136707     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3095503     Document Type: Article

References (28)

1. K. A. Dean, Nat. Photonics, 1, 273 (2007).
2. S. Itoh, M. Tanaka, and T. Tonegawa, J. Vac. Sci. Technol. B, 22, 1362 (2004).
3. C. C. Kang and R. S. Liu, J. Lumin., 122, 574 (2007).
4. X. M. Liu, P. Y. Jia, J. Lin, and G. Z. Li, J. Appl. Phys., 99, 124902 (2006).
5. S. J. Kim, H. H. Yoon, S. J. Park, Y. S. Park, and H. W. Choi, Jpn. J. Appl. Phys., 47, 784 (2008).
6. X. M. Liu and J. Lin, J. Appl. Phys., 100, 124306 (2006).
7. J. H. Hao and M. Cocivera, Appl. Phys. Lett., 81, 4154 (2002).
8. J. H. Hao and M. Cocivera, Appl. Phys. Lett., 79, 740 (2001).
9. X. Jing, T. G. Ireland, C. Gibbons, D. J. Barber, J. Silver, A. Vecht, G. Fern, P. Trogwa, and D. Morton, J. Electrochem. Soc., 146, 4546 (1999).
10. A. Vecht, C. Gibbons, D. Davies, X. Jing, P. Marsh, T. G. Ireland, J. Silver, and A. Newport, J. Vac. Sci. Technol. B, 17, 750 (1999).
11. J. H. Hao, S. A. Studenikin, and M. Cocivera, J. Appl. Phys., 90, 5064 (2001).
12. I. W. Lenggoro, T. Hata, F. Iskandar, M. M. Lunden, and K. Okuyama, J. Mater. Res., 15, 743 (2000).
13. J. Silver, R. Withnall, A. Lipman, T. G. Ireland, and G. R. Fern, J. Lumin., 122, 562 (2007).
14. K. E. McBean, M. R. Phillips, and E. M. Goldys, Microsc. Microanal., 12, 327 (2006).
15. P. Psuja, D. Hreniak, and W. Strek, J. Nanomater., 2007, 81350.
16. Z. L. Wang, G. Z. Li, Z. W. Quan, D. Y. Kong, X. M. Liu, M. Yu, and J. Lin, J. Nanosci. Nanotechnol., 7, 602 (2007).
17. Z. L. Wang, H. L. Li, and J. H. Hao, J. Electrochem. Soc., 155, J152 (2008).
18. H. O. Jungk and C. Feldmann, Angew. Chem., Int. Ed., 40, 297 (2001).
19. C. Feldmann, Solid State Sci., 7, 868 (2005).
20. X. M. Wang, H. Y. Xu, H. Wang, and H. Yan, J. Cryst. Growth, 284, 254 (2005).
21. T. T. Basiev, A. A. Sobol, Y. K. Voronko, and P. G. Zverev, Opt. Mater., 15, 205 (2000).
22. J. H. Ryu, J. W. Yoon, and K. B. Shim, Electrochem. Solid-State Lett., 8, D15 (2005).
23. F. M. Pontes, M. A. Maurera, A. G. Souza, E. Longo, E. R. Leite, R. Magnani, M. A. C. Machado, P. S. Pizani, and J. A. Varela, J. Eur. Ceram. Soc., 23, 3001 (2003).
24. Y. Oaki and H. Imai, Adv. Mater. (Weinheim, Ger.), 18, 1807 (2006).
25. S. Mukarami, H. Markus, R. Doris, and M. Makato, Inorg. Chim. Acta, 300-302, 1014 (2000).
26. C. Feldmann, Phys. Rev., 117, 455 (1960).
27. A. Chakhovskoi, C. Hunt, M. Malinowski, T. Felter, and A. Talin, J. Vac. Sci. Technol. B, 15, 507 (1997).
28. Z. D. Lou and J. H. Hao, Thin Solid Films, 450, 334 (2004).