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Volumn 156, Issue 5, 2009, Pages
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Structural analysis using synchrotron XRD and XAFS for cobalt oxyhydroxides heat-treated under Sodium hydroxide solution for Nickel hydroxide electrode
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Author keywords
[No Author keywords available]
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Indexed keywords
COBALT;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
LATTICE CONSTANTS;
OXIDATION;
STRUCTURAL ANALYSIS;
SYNCHROTRONS;
COBALT IONS;
COBALT OXIDATIONS;
ELECTRICAL CONDUCTIVITIES;
ELECTRICAL RESISTIVITIES;
HEAT-TREATMENT;
HIGH-ENERGY SYNCHROTRON X-RAYS;
NICKEL HYDROXIDE ELECTRODES;
OXIDATION STATE;
OXYHYDROXIDE;
OXYHYDROXIDES;
S-PHASE;
SODIUM HYDROXIDE SOLUTIONS;
STRUCTURAL REFINEMENTS;
TEMPERATURE RANGES;
TREATMENT TEMPERATURES;
TWO-PHASE MODELS;
X- RAY ABSORPTION FINE STRUCTURE ANALYSIS;
XAFS;
XRD;
X RAY DIFFRACTION ANALYSIS;
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EID: 63649135271
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.3079421 Document Type: Article |
Times cited : (11)
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References (9)
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