Applications of the rotating orientation XRD method to oriented materials

Journal of Physics D: Applied Physics

Volumn 42, Issue 1, 2009, Pages

  Guo, Zhenqi ^a   Jin, Li ^b   Li, Fei ^a   Bai, Yu ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; CRYSTAL CUTTING; ROTATION; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

BULK MATERIALS; CRYSTAL QUALITIES; LARGE GRAINS; ORIENTED THIN FILMS; X- RAY DIFFRACTIONS; XRD; XRD TECHNIQUES;

CRYSTAL ORIENTATION;

EID: 63649125718     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/1/012001     Document Type: Article

References (5)

1. Cullity B D 1978 Elements of X-ray Diffraction 2nd edn (New York: Addison-Wesley)
2. Guo Z Q, Fu T and Fu H Z 2000 Crystal orientation measured by XRD and annotation of the butterfly diagram Mater. Charact. 44 431
3. Guo Z Q 2007 An XRD rotating table for random distribution and textural crystals orientation Chinese Patent ZL200620079376.7
4. Li H Y and Jie W Q 2003 Growth and characterizations of bulk ZnSe single crystal by chemical vapor transport J. Cryst. Growth 257 110
5. 5 system J. Cryst. Growth 279 5