Portable UV-visible spectrometer for measuring absorbance and dichroism of Langmuir monolayers at air-water interfaces

Review of Scientific Instruments

Volumn 80, Issue 3, 2009, Pages

  Tronin, Andrey ^a   Strzalka, Joseph ^a,b   Krishnan, Venkata ^a   Kuzmenko, Ivan ^b   Fry, H Christopher ^a   Therien, Michael ^c   Blasie, J Kent ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMINES; CHROMOPHORES; DICHROISM; ELECTRON ENERGY LEVELS; FATTY ACIDS; LIGHT; LIGHT SOURCES; MONOLAYERS; OPTICAL MATERIALS; OPTOELECTRONIC DEVICES; PHASE INTERFACES; PORPHYRINS; SCATTERING; SENSORS; SPECTROMETRY; SPECTROSCOPIC ANALYSIS; X RAY SCATTERING;

ABSORBANCE; AIR-WATER INTERFACES; AMPHIPHILIC DYES; AMPHIPHILIC PORPHYRINS; BINDING PEPTIDES; BOUND STATE; EXPERIMENTAL ENVIRONMENTS; EXPERIMENTAL TECHNIQUES; FATTY ACID MONOLAYERS; HIGH SENSITIVITIES; IN-SITU; LANGMUIR MONOLAYERS; LANGMUIR TROUGHS; MATRIXES; MODEL SYSTEMS; MULTI PASS; OPTICS DESIGNS; SPECTRAL STUDIES; SPECTROSCOPIC DATUM; SPECTROSCOPIC MEASUREMENTS; STAND -ALONE; STUDY SAMPLES; SYNCHROTRON X-RAY SCATTERINGS; UV-VISIBLE; UV-VISIBLE ABSORBANCE SPECTROSCOPIES; UV-VISIBLE SPECTROMETERS; X -RAY SCATTERINGS;

SPECTROMETERS;

WATER;

AIR; ARTICLE; CHEMISTRY; CIRCULAR DICHROISM; COMPUTER AIDED DESIGN; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIPID BILAYER; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; ULTRAVIOLET SPECTROPHOTOMETRY;

AIR; CIRCULAR DICHROISM; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIPID BILAYERS; MINIATURIZATION; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTROPHOTOMETRY, ULTRAVIOLET; SURFACE PROPERTIES; WATER;

EID: 63649119399     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3089807     Document Type: Article

References (27)

1. H. Gruniger, D. Mobius, and H. Meyer, J. Chem. Phys. 0021-9606 10.1063/1.446290 79, 3701 (1983).
2. D. Mobius, M. Orrit, H. Gruniger, and H. Meyer, Thin Solid Films 0040-6090 10.1016/0040-6090(85)90455-9 132, 41 (1985).
3. J. M. Pedrosa, C. M. Dooling, T. H. Richardson, R. K. Hyde, C. A. Hunter, M. T. Martin, and L. Camacho, Langmuir 18, 7594 (2002). 0743-7463
4. P. Cea, S. Martin, A. Villares, D. Mobius, and M. C. Lopez, J. Phys. Chem. B 1089-5647 10.1021/jp055673o 110, 963 (2006).
5. P. L. Edmiston, J. E. Lee, S. S. Cheng, and S. S. Saavedra, J. Am. Chem. Soc. 0002-7863 10.1021/ja962366a 119, 560 (1997).
6. M. A. Bos and J. M. Kleijn, Biophys. J. 0006-3495 10.1016/S0006-3495(95) 80439-X 68, 2566 (1995).
7. A. Tronin, J. Strzalka, X. Chen, P. L. Dutton, and J. K. Blasie, Langmuir 0743-7463 10.1021/la000935t 16, 9878 (2000).
8. A. Tronin, T. Xu, and J. K. Blaise, Langmuir 0743-7463 10.1021/la051050q 21, 7760 (2005).
9. A. Tronin, J. Strzalka, X. Chen, P. L. Dutton, B. M. Ocko, and J. K. Blaise, Langmuir 0743-7463 10.1021/la001489c 17, 3061 (2001).
10. X. L. Li, W. Q. Xu, H. Y. Jia, X. Wang, B. Zhao, B. F. Li, and Y. Ozaki, J. Colloid Interface Sci. 0021-9797 10.1016/j.jcis.2004.01.043 274, 9 (2004).
11. S. B. Yamaki A. A. Andrade, C. R. Mendonca, O. N. Oliveria, and T. D. Z. Atvars, J. Colloid Interface Sci. 0021-9797 10.1016/j.jcis.2004.09.007 283, 464 (2005).
12. S. V. Mello, C. Coutures, R. M. Leblanc, T. C. Cheng, V. K. Rastogi, and J. J. DeFrank, Talanta 0039-9140 10.1016/S0039-9140(01)00499-4 55, 881 (2001).
13. B. Mecheri, P. Baglioni, O. Pieroni, and G. Caminati, Mater. Sci. Eng., C 23, 893 (2003).
14. H. G. Liu, X. S. Fend, L. J. Zhang, G. L. Ji, D. J. Qian, Y. I. Lee, and K. Z. Yang, Mater. Sci. Eng., C 23, 585 (2003).
15. M. Yoneyama, M. Sugi, M. Saito, K. Ikegami, S. Kuroda, and S. Iizima, Jpn. J. Appl. Phys., Part 1 25, 961 1986. 0021-9797
16. G. Decher and F. Klinkhammer, Makromol. Chem., Macromol. Symp. 46, 19 (1991).
17. P. L. Edmiston, J. E. Lee, L. L. Wood, and S. S. Saavedra, J. Phys. Chem. 0022-3654 10.1021/jp952037p 100, 775 (1996).
18. A. Tronin and J. K. Blasie, Langmuir 17, 3696 (2001). 0743-7463
19. X. X. Chen, C. C. Moser, D. L. Pilloud, and P. L. Dutton, J. Phys. Chem. B 1089-5647 10.1021/jp981855p 102, 6425 (1998).
20. H. T. Uyeda, Y. X. Zhao, K. Wostyn, I. Asselberghs, K. Clays, A. Persoons, M. J. Therien, J. Am. Chem. Soc. 124, 13806 (2002). 0002-7863
21. T. Xu, S. P. Wu, I. Miloradovic, M. J. Therien, and J. K. Blasie, Nano Lett. 6, 2387 (2006). 1530-6984
22. S. Ye, J. W. Strzalka, B. M. Discher, D. Noy, S. Y. Zheng, P. L. Dutton, and J. K. Blasie, Langmuir 20, 5897 (2004). 0743-7463
23. S. Ye, B. M. Discher, J. W. Strzalka, T. Xu, S. P. Wu, D. Noy, I. Kuzmenko, T. Gog, M. J. Therien, P. L. Dutton, and J. K. Blasie, Nano Lett. 5, 1658 (2005). 1530-6984
24. J. Strzalka, T. Xu, A. Tronin, S. P. Wu, I. Miloradovic, I. Kuzmenko, T. Gog, M. J. Therien, and J. K. Blasie, Nano Lett. 6, 2395 (2006). 1530-6984
25. D. M. Cropek and P. W. Bohn, J. Phys. Chem. 0022-3654 10.1021/j100379a054 94, 6452 (1990).
26. T. G. Zhang, Y. X. Zhao, I. Asselberghs, A. Persoons, K. Clays, and M. J. Therien, J. Am. Chem. Soc. 127, 9710 (2005). 0002-7863
27. J. K. Blasie, S. Zheng, and J. Strzalka, Phys. Rev. B 0163-1829 10.1103/PhysRevB.67.224201 67, 224201 (2003).