Which semi-local visual masking model for wavelet based image quality metric?

Proceedings - International Conference on Image Processing, ICIP

Volumn , Issue , 2008, Pages 1180-1183

  Ninassi, A ^a,b   Meur, O Le ^a   Callet, P Le ^b   Barba, D ^b  

^a FCA UNESP   (Brazil)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

Contrast masking; Entropy masking; Human Visual System; Quality assessment; Semi local masking

Indexed keywords

CONTRAST MASKING; ENTROPY MASKING; HUMAN VISUAL SYSTEM; QUALITY ASSESSMENT; SEMI-LOCAL MASKING;

DISPLAY DEVICES; EXPERIMENTS; IMAGING SYSTEMS; WAVELET ANALYSIS;

IMAGE QUALITY;

EID: 63649105411     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2008.4711971     Document Type: Conference Paper

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