Study of alkali silicate glass corrosion using spectroscopic ellipsometry and secondary ion mass spectrometry

Physics and Chemistry of Glasses

Volumn 44, Issue 4, 2003, Pages 303-307

  Portal, S ^a   Sempere, R ^a  

^a UNIVERSITÉ MONTPELLIER 2   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALI; GLASS; SILICATE; SODIUM;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CORROSION; ELLIPSOMETRY; LEACHING; MASS SPECTROMETRY; REFRACTION INDEX; SPECTROSCOPY; SURFACE PROPERTY; THICKNESS;

EID: 6344287124     PISSN: 00319090     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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10. Bruggemann, D. A. G. Ann. Physik (Leipzig). 1935, 24, 636.
11. Gossink, R. G., De Grefte, H. A. M. & Werner, H. W. Analysis of sodium depth profiles in glasses using secondary ion mass spectrometry (SIMS). Silicates Ind., 1979, 2, 35-41.
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