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Volumn , Issue , 2000, Pages 63-66

Simulation of orientation-dependent etching of silicon using a new step flow model of 3D structuring

Author keywords

3D Simulation; Orientation Dependent Wet Chemical Etching; Silicon

Indexed keywords

COMPOSITE MICROMECHANICS; COMPUTER SIMULATION; CRYSTALLOGRAPHY; DIFFERENTIAL EQUATIONS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON; SOLUTIONS;

EID: 6344280998     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 4
    • 6344263623 scopus 로고    scopus 로고
    • Ph.D. Thesis, Technical University of Ilmenau
    • Heim, U., Ph.D. Thesis, Technical University of Ilmenau, 1996.
    • (1996)
    • Heim, U.1
  • 9
    • 0005399419 scopus 로고
    • SISDEP-93, Vienna, Austria, Eds.: S. Selberherr, H. Stippel, E. Strasser (Springer Verlag, Wien, 1993)
    • Strasser, E., Selberherr, S., SISDEP-93, Vienna, Austria, in Simulation of Semiconductor Devices and Processes, Eds.: S. Selberherr, H. Stippel, E. Strasser (Springer Verlag, Wien, 1993) pp. 357-360, 1993.
    • (1993) Simulation of Semiconductor Devices and Processes , pp. 357-360
    • Strasser, E.1    Selberherr, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.