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Volumn A, Issue , 2003, Pages 106-109

Aluminium-induced crystallisation of amorphous silicon: Influence of oxidation conditions

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION FURNANCES; EUTECTIC TEMPERATURE; SILICON GRAIN SIZE;

EID: 6344278518     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (3)
  • 1
    • 0001761088 scopus 로고    scopus 로고
    • Aluminium-induced crystallisation of amorphous silicon on glass sustrates above and below the eutectic temperature
    • O. Nast, T. Puzzer, L. M. Koschier, A. B. Sproul, and S. R. Wenham, "Aluminium-induced crystallisation of amorphous silicon on glass sustrates above and below the eutectic temperature", Appl. Phys. Lett., 73, 3214 (1998).
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 3214
    • Nast, O.1    Puzzer, T.2    Koschier, L.M.3    Sproul, A.B.4    Wenham, S.R.5
  • 2
    • 0001039356 scopus 로고    scopus 로고
    • Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization
    • O. Nast and S. R. Wenham, "Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization", J. Appl. Phys., 88 (1), 124 (2000).
    • (2000) J. Appl. Phys. , vol.88 , Issue.1 , pp. 124
    • Nast, O.1    Wenham, S.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.