Optical constants of Cu(lN,GA)SE2 thin films from normal incidence transmittance and reflectance

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn A, Issue , 2003, Pages 372-375

  Orgassa, K ^a   Rau, U ^a   Schock, H W ^a   Werner, J H ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PLANE LAYERS; SPECTRAL ELLIPSOMETRY; TERNARY COMPOUNDS; WAVELENGTHS;

COPPER COMPOUNDS; CURVE FITTING; EVAPORATION; LIGHT REFLECTION; LIGHT TRANSMISSION; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS;

THIN FILMS;

EID: 6344277131     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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