Test coverage analysis based on program slicing

Proceedings of the 2003 IEEE International Conference on Information Reuse and Integration, IRI 2003

Volumn , Issue , 2003, Pages 559-565

  Chen, Zhenqiang ^a,b   Xu, Baowen ^a,b,c   Yang, Hongji ^d   Chen, Huowang ^c  

^a SOUTHEAST UNIVERSITY   (China)

^b Jiangsu Institute of Software Quality   (China)

^c NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^d DE MONTFORT UNIVERSITY   (United Kingdom)

Author keywords

Coverage analysis; Program analysis; Program slicing; Software testing; Structural testing

Indexed keywords

INFORMATION USE; TESTING;

COVERAGE ANALYSIS; CURRENT LAYERS; PROGRAM ANALYSIS; PROGRAM SLICING; RANK DIFFERENCES; STRUCTURAL TESTING; TEST COVERAGE; UPPER LAYER;

SOFTWARE TESTING;

EID: 6344267511     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRI.2003.1251465     Document Type: Conference Paper

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