New analysis method for crystalline silicon cells

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1521-1524

  Hyvärinen, Jaakko ^a   Karila, Juha ^a  

^a Endeas Oy   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON CELLS; FITTING PROBLEM; SOLAR SIMULATORS; VARIABLE ILLUMINATION;

CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; EQUIVALENT CIRCUITS; PROBLEM SOLVING; REGRESSION ANALYSIS; SENSORS;

SILICON SOLAR CELLS;

EID: 6344265679     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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2. A. Aberle, S. Wenham and M. Green, "A New Method for Accurate Measurement of the Lumped Series Resistance of Solar Cells", 23th IEEE PVSEC, 1993, p. 133.
3. V: Martinez, R. Lizundia and J. C. Cimeno, "MultiIV, a Computer Program to Fit I-V Characteristics", Eleventh E.C. Photovoltaic Solar Energy Conference, Montreux, Switzerland, 1992, p. 314
4. N.Enebish et al, "Numerical analysis of solar cell current-voltage characteristics", Solar Energy Materials and Solar Cells, 29, (1993), p. 201-208.
5. S. M. Sze, Physics of Semiconductor Devices, John Wiley & Sons, Inc., 1969, p. 24-27, 643-648.
6. Araujo, Cuevaz, Ruiz, IEEE Trans. El. Dev., 33, No.3, (1986), p. 391.
7. A. Pots and J. E. Parrott, "Modelling of Distributed Resistance in Solar Cell Devices", Eleventh E.C. Photovoltaic Solar Energy Conference, Montreux, Switzerland, 1992, p. 306.
8. R. O. Bell, "Measurement and Analysis of I-V curves as Applied to EFG Solar Cells", Ninth E.C. Photovoltaic Solar Energy Conference, Freiburg, Germany, (1989), Switzerland, 1992, p. 386