A novel approach to compact I-V modeling for deep-submicron MOSFET's technology development and circuit simulation

2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000

Volumn , Issue , 2000, Pages 333-336

  Zhou, Xing ^a   Lim, Khee Yong ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Compact model; De embed; MOSFET; Parameter extraction; Process correlation

Indexed keywords

CHANNEL LENGTH MODULATION (CLM); CIRCUIT SIMULATION; COMPACT MODELS; PARAMETER EXTRACTION; PROCESS CORRELATION;

CMOS INTEGRATED CIRCUITS; CRITICAL CURRENTS; FUNCTIONS; ITERATIVE METHODS; LEAKAGE CURRENTS; MATHEMATICAL MODELS; SURFACE ROUGHNESS; ULSI CIRCUITS;

MOSFET DEVICES;

EID: 6344262126     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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