Simulated waste glass corrosion in humic acid solution using rutherford backscattering spectrometry

Journal of Nuclear Science and Technology

Volumn 41, Issue 8, 2004, Pages 837-842

  Takagi, Ikuji ^a   Sasaki, Takayuki ^a   Asahara, Kunio ^a   Kawasaki, Toru ^a   Ishidera, Takamitsu ^a   Moriyama, Hirotake ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Accumulation; Corrosion; Depth profile; Dissolution; Humic acid; ICP AES; PIXE; Rutherford backscattering spectrometry; Simulated waste glass; Surface

Indexed keywords

ACCUMULATION; DEPTH PROFILE; HUMIC ACID; PARTICLE INDUCED X-RAY EMISSION (PIXE); SIMULATED WASTE GLASS;

AMPLIFIERS (ELECTRONIC); CORROSION RESISTANCE; DENSITY (OPTICAL); DISSOLUTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; VOLUME MEASUREMENT; X RAY ANALYSIS;

GLASS;

EID: 6344260098     PISSN: 00223131     EISSN: None     Source Type: Journal    
DOI: 10.1080/18811248.2004.9715554     Document Type: Article

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