A physics-based impact ionization model using six moments of the boltzmann transport equation

2001 International Conference on Modeling and Simulation of Microsystems - MSM 2001

Volumn , Issue , 2001, Pages 474-477

  Grasser, T ^a   Kosina, H ^a   Gritsch, M ^a   Selberherr, S ^a  

^a INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

Boltzmann's equation; Device simulation; Impact ionization; Moments method

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRON TRANSPORT PROPERTIES; IMPACT IONIZATION; MATHEMATICAL MODELS; MAXWELL EQUATIONS; METHOD OF MOMENTS; MONTE CARLO METHODS;

BOLTZMANN'S EQUATIONS; CARRIER DISTRIBUTION; DEVICE SIMULATION;

CHARGE CARRIERS;

EID: 6344257163     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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