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Volumn 3, Issue , 2003, Pages 51-54

AFM anodization studied by spectromicroscopy

Author keywords

AFM local anodic oxidation; Microspectroscopy; Photodesorbtion

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; BINDING ENERGY; CAMERAS; CHARGE COUPLED DEVICES; NANOTECHNOLOGY; PHOTOEMISSION; PHOTONS; STOICHIOMETRY; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 6344243053     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (15)
  • 8
    • 0002964865 scopus 로고    scopus 로고
    • S. Heun, Th. Schmidt, B. Ressel, E. Bauer, and K. C. Prince, Synchrotron Radiation News, Vol. 12, No. 5 (1999), p.25. See also www.elettra.trieste.it/ /experiments/beamlines/nano/index.html
  • 11
    • 6344245071 scopus 로고    scopus 로고
    • M. Lazzarino et al. to be published
    • M. Lazzarino et al. to be published
  • 12
    • 6344264394 scopus 로고    scopus 로고
    • A. Ballestrazzi et al. to be published
    • A. Ballestrazzi et al. to be published


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.