The application of case-based reasoning to defect interpretation in nondestructive testing

Proceedings of 2004 International Conference on Machine Learning and Cybernetics

Volumn 4, Issue , 2004, Pages 2296-2300

  Qu, Ri ^a   Ren, Chang Ming ^a   Bao, Yan Ru ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Case based reasoning; Data interpretation; Electronic shearing speckle pattern interferometry; Non destructive testing

Indexed keywords

DATA REDUCTION; DEFECTS; INSPECTION; INTERFEROMETRY; KNOWLEDGE BASED SYSTEMS; SENSITIVITY ANALYSIS; SPECKLE;

CASE BASED REASONING; DATA INTERPRETATION; ELECTRONIC SHEARING SPECKLE PATTERN INTERFEROMETRY;

NONDESTRUCTIVE EXAMINATION;

EID: 6344240525     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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