A simple method for checking the illumination profile in a laser scanning microscope and the dependence of resolution on this profile

Scanning

Volumn 26, Issue 5, 2004, Pages 256-258

  Kuypers, Liesbeth C ^a   Dirckx, J J J ^a   Decraemer, W F ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Apodization; Confocal microscopy; Homogenous or Gaussian pupil illumination; Laser scanning microscopy; Photodiode; Resolution

Indexed keywords

LASER BEAMS; LIGHTING; OPTICAL SYSTEMS; PHOTODIODES;

CONFOCAL SYSTEMS; ILLUMINATION INTENSITY; LASER SCANNING MICROSCOPES; OBJECTIVE LENS;

LASERS;

ARTICLE; CONFOCAL MICROSCOPY; ILLUMINATION; LASER; LASER MICROSCOPY; LENS; MICROSCOPE; MICROSCOPY; PRIORITY JOURNAL;

ILLUMINATION; LASERS; OPTICAL INSTRUMENTS; PHOTODIODES;

EID: 6344234795     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950260507     Document Type: Article

References (8)

1. Booth MJ, Wilson T: Strategies for the compensation of specimen-induced spherical aberration in confocal microscopy of skin. J Microsc 200, 68-74 (2000)
2. Egner A, Schrader M, Hell SW: Refractive index mismatch induced intensity and phase variations in fluorescence confocal, multiphoton and 4Pi-microscopy. Opt Commun 153, 211-217 (1998)
3. Hell S, Reiner G, Cremer C, Stelzer EHK: Aberrations in confocal fluorescence microscopy induced by mismatches in refractive index. J Microsc 169, 391-405 (1993)
4. Sheppard CJR, Török P: Effects of specimen refractive index on confocal imaging. J Microsc 185, 366-374 (1997)
5. Stelzer EHK: In Handbook of Biological Confocal Microscopy (Ed. Pawley JB). Plenum Press, New York (1995) Chapter 9, 141-142
6. Török P, Varga P, Booker GR: Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: Structure of the electromagnetic field. J Opt Soc Am A 12, 2136-2144 (1995)
7. Wiersma SH, Visser TD.: Defocusing of a converging electromagnetic wave by a plane dielectric interface. J Opt Soc Am A 13, 320-325 (1996)
8. Zeiss: Carl Zeiss Mikroskopie Köln. Personal communication (2003)